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@ARTICLE{Fardmanesh:17127,
      author       = {Fardmanesh, M. and Schubert, J. and Akram, R. and Bozbey,
                      A. and Bick, M. and Banzet, M. and Lomparski, D. and Zander,
                      W. and Zhang, Y. and Krause, H.-J.},
      title        = {{J}unction {C}haracteristics and {M}agnetic {F}ield
                      {D}ependence of {L}ow {N}oise {S}tep {E}dge {J}unction
                      rf-{SQUID}s for {U}nshielded {A}pplications},
      journal      = {IEEE transactions on applied superconductivity},
      volume       = {13},
      issn         = {1051-8223},
      address      = {New York, NY},
      publisher    = {IEEE},
      reportid     = {PreJuSER-17127},
      pages        = {833 - 836},
      year         = {2003},
      note         = {Record converted from VDB: 12.11.2012},
      abstract     = {Step edge grain boundary (GB) junctions and rf-SQUIDs have
                      been made using pulsed laser deposited Y-Ba-Cu-O films on
                      crystalline LaAlO3 substrates. The steps were developed
                      using various ion-beam etching processes resulting in sharp
                      and ramp type step structures. Sharp step based GB
                      junction's showed behavior of serial junctions with
                      resistively shunted junction (RSJ)-like I-V characteristics,
                      The ramped type step structures resulted in relatively high
                      critical current, I-c, junctions and noisy SQUIDs. The sharp
                      steps resulted in low noise rf-SQUIDs with a noise level
                      below 140 fT/rootHz(1/2) down to. few Hz at 77 K while
                      measured with conventional tank circuits. The, I. of the
                      junctions and hence the opetrating temperature range of the
                      SQUIDs made using sharp steps was controlled by both the
                      step height and the junction widths. The junction properties
                      of the SQUIDs were also characterized showing RSJ-like
                      characteristics and magnetic field sensitivities correlated
                      to that of the SQUIDs. Two major tow and high background
                      magnetic field sensitivities have been observed for our step
                      edge junctions and the SQUIDs made on sharp steps. High
                      quality step edge junctions with low magnetic field
                      sensitivities made on clean sharp steps resulted in low 1/f
                      noise rf-SQUIDs proper for applications in unshielded
                      environment.},
      keywords     = {J (WoSType)},
      cin          = {ISG-2 / ISG-1 / CNI},
      ddc          = {530},
      cid          = {I:(DE-Juel1)VDB42 / I:(DE-Juel1)VDB41 / I:(DE-Juel1)VDB381},
      pnm          = {Materialien, Prozesse und Bauelemente für die Mikro- und
                      Nanoelektronik},
      pid          = {G:(DE-Juel1)FUEK252},
      shelfmark    = {Engineering, Electrical $\&$ Electronic / Physics, Applied},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000184241700188},
      doi          = {10.1109/TASC.2003.814060},
      url          = {https://juser.fz-juelich.de/record/17127},
}