%0 Journal Article
%A Herpers, Anja
%A Lenser, Christian
%A Park, Chanwoo
%A Offi, Francesco
%A Borgatti, Francesco
%A Panaccione, Giancarlo
%A Menzel, Stephan
%A Waser, Rainer
%A Dittmann, Regina
%T Spectroscopic Proof of the Correlation between Redox-State and Charge-Carrier Transport at the Interface of Resistively Switching Ti/PCMO Devices
%J Advanced materials
%V 26
%N 17
%@ 0935-9648
%C Weinheim
%I Wiley-VCH
%M FZJ-2014-05321
%P 2730 - 2735
%D 2014
%X By using hard X-ray photoelectron spectroscopy experimentally, proof is provided that resistive switching in Ti/Pr0.48Ca0.52MnO3 (PCMO) devices is based on a redox-process that mainly occurs on the Ti-side. The different resistance states are determined by the amount of fully oxidized Ti-ions in the stack, implying a reversible redox-reaction at the interface, which governs the formation and shortening of an insulating tunnel barrier. 
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000335401100018
%R 10.1002/adma.201304054
%U https://juser.fz-juelich.de/record/171755