000171755 001__ 171755
000171755 005__ 20210129214310.0
000171755 0247_ $$2doi$$a10.1002/adma.201304054
000171755 0247_ $$2ISSN$$a0935-9648
000171755 0247_ $$2ISSN$$a1521-4095
000171755 0247_ $$2WOS$$aWOS:000335401100018
000171755 037__ $$aFZJ-2014-05321
000171755 082__ $$a540
000171755 1001_ $$0P:(DE-Juel1)140552$$aHerpers, Anja$$b0$$eCorresponding Author$$ufzj
000171755 245__ $$aSpectroscopic Proof of the Correlation between Redox-State and Charge-Carrier Transport at the Interface of Resistively Switching Ti/PCMO Devices
000171755 260__ $$aWeinheim$$bWiley-VCH$$c2014
000171755 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1413955508_8747
000171755 3367_ $$2DataCite$$aOutput Types/Journal article
000171755 3367_ $$00$$2EndNote$$aJournal Article
000171755 3367_ $$2BibTeX$$aARTICLE
000171755 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000171755 3367_ $$2DRIVER$$aarticle
000171755 520__ $$aBy using hard X-ray photoelectron spectroscopy experimentally, proof is provided that resistive switching in Ti/Pr0.48Ca0.52MnO3 (PCMO) devices is based on a redox-process that mainly occurs on the Ti-side. The different resistance states are determined by the amount of fully oxidized Ti-ions in the stack, implying a reversible redox-reaction at the interface, which governs the formation and shortening of an insulating tunnel barrier. 
000171755 536__ $$0G:(DE-HGF)POF2-421$$a421 - Frontiers of charge based Electronics (POF2-421)$$cPOF2-421$$fPOF II$$x0
000171755 588__ $$aDataset connected to CrossRef, juser.fz-juelich.de
000171755 7001_ $$0P:(DE-Juel1)138081$$aLenser, Christian$$b1$$ufzj
000171755 7001_ $$0P:(DE-Juel1)144378$$aPark, Chanwoo$$b2
000171755 7001_ $$0P:(DE-HGF)0$$aOffi, Francesco$$b3
000171755 7001_ $$0P:(DE-HGF)0$$aBorgatti, Francesco$$b4
000171755 7001_ $$0P:(DE-HGF)0$$aPanaccione, Giancarlo$$b5
000171755 7001_ $$0P:(DE-Juel1)158062$$aMenzel, Stephan$$b6$$ufzj
000171755 7001_ $$0P:(DE-HGF)0$$aWaser, Rainer$$b7
000171755 7001_ $$0P:(DE-Juel1)130620$$aDittmann, Regina$$b8$$ufzj
000171755 773__ $$0PERI:(DE-600)1474949-x$$a10.1002/adma.201304054$$gVol. 26, no. 17, p. 2730 - 2735$$n17$$p2730 - 2735$$tAdvanced materials$$v26$$x0935-9648$$y2014
000171755 8564_ $$uhttps://juser.fz-juelich.de/record/171755/files/FZJ-2014-05321.pdf$$yRestricted
000171755 909CO $$ooai:juser.fz-juelich.de:171755$$pVDB
000171755 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)140552$$aForschungszentrum Jülich GmbH$$b0$$kFZJ
000171755 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)138081$$aForschungszentrum Jülich GmbH$$b1$$kFZJ
000171755 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)158062$$aForschungszentrum Jülich GmbH$$b6$$kFZJ
000171755 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-HGF)0$$aForschungszentrum Jülich GmbH$$b7$$kFZJ
000171755 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130620$$aForschungszentrum Jülich GmbH$$b8$$kFZJ
000171755 9132_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$aDE-HGF$$bPOF III$$lKey Technologies$$vFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$x0
000171755 9131_ $$0G:(DE-HGF)POF2-421$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vFrontiers of charge based Electronics$$x0
000171755 9141_ $$y2014
000171755 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000171755 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000171755 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000171755 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000171755 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000171755 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000171755 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000171755 915__ $$0StatID:(DE-HGF)0310$$2StatID$$aDBCoverage$$bNCBI Molecular Biology Database
000171755 915__ $$0StatID:(DE-HGF)0420$$2StatID$$aNationallizenz
000171755 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000171755 915__ $$0StatID:(DE-HGF)1160$$2StatID$$aDBCoverage$$bCurrent Contents - Engineering, Computing and Technology
000171755 915__ $$0StatID:(DE-HGF)9915$$2StatID$$aIF >= 15
000171755 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000171755 980__ $$ajournal
000171755 980__ $$aVDB
000171755 980__ $$aI:(DE-Juel1)PGI-7-20110106
000171755 980__ $$aUNRESTRICTED