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@ARTICLE{Herpers:171755,
author = {Herpers, Anja and Lenser, Christian and Park, Chanwoo and
Offi, Francesco and Borgatti, Francesco and Panaccione,
Giancarlo and Menzel, Stephan and Waser, Rainer and
Dittmann, Regina},
title = {{S}pectroscopic {P}roof of the {C}orrelation between
{R}edox-{S}tate and {C}harge-{C}arrier {T}ransport at the
{I}nterface of {R}esistively {S}witching {T}i/{PCMO}
{D}evices},
journal = {Advanced materials},
volume = {26},
number = {17},
issn = {0935-9648},
address = {Weinheim},
publisher = {Wiley-VCH},
reportid = {FZJ-2014-05321},
pages = {2730 - 2735},
year = {2014},
abstract = {By using hard X-ray photoelectron spectroscopy
experimentally, proof is provided that resistive switching
in Ti/Pr0.48Ca0.52MnO3 (PCMO) devices is based on a
redox-process that mainly occurs on the Ti-side. The
different resistance states are determined by the amount of
fully oxidized Ti-ions in the stack, implying a reversible
redox-reaction at the interface, which governs the formation
and shortening of an insulating tunnel barrier.},
cin = {PGI-7},
ddc = {540},
cid = {I:(DE-Juel1)PGI-7-20110106},
pnm = {421 - Frontiers of charge based Electronics (POF2-421)},
pid = {G:(DE-HGF)POF2-421},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000335401100018},
doi = {10.1002/adma.201304054},
url = {https://juser.fz-juelich.de/record/171755},
}