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000171757 037__ $$aFZJ-2014-05323
000171757 1001_ $$0P:(DE-Juel1)130677$$aGunkel, Felix$$b0$$eCorresponding Author$$ufzj
000171757 1112_ $$aInt. Workshop on Oxide Electronics$$cBolton Landing, NY$$d2014-09-28 - 2014-10-01$$wUSA
000171757 245__ $$aAnomalous transport at oxide interfaces: Detecting magnetism in the Hall effect in NdGaO$_{3}$/SrTiO$_{3}$ heterostructures
000171757 260__ $$c2014
000171757 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1413955800_8750$$xOther
000171757 3367_ $$033$$2EndNote$$aConference Paper
000171757 3367_ $$2DataCite$$aOther
000171757 3367_ $$2ORCID$$aLECTURE_SPEECH
000171757 3367_ $$2DRIVER$$aconferenceObject
000171757 3367_ $$2BibTeX$$aINPROCEEDINGS
000171757 536__ $$0G:(DE-HGF)POF2-424$$a424 - Exploratory materials and phenomena (POF2-424)$$cPOF2-424$$fPOF II$$x0
000171757 7001_ $$0P:(DE-HGF)0$$aKim, B.$$b1
000171757 7001_ $$0P:(DE-HGF)0$$aHarashima, S.$$b2
000171757 7001_ $$0P:(DE-Juel1)138790$$aJin, Lei$$b3$$ufzj
000171757 7001_ $$0P:(DE-Juel1)130717$$aHoffmann-Eifert, Susanne$$b4$$ufzj
000171757 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b5$$ufzj
000171757 7001_ $$0P:(DE-HGF)0$$aBell, C.$$b6
000171757 7001_ $$0P:(DE-HGF)0$$aHwang, H. Y.$$b7
000171757 7001_ $$0P:(DE-Juel1)130620$$aDittmann, Regina$$b8$$ufzj
000171757 773__ $$y2014
000171757 909CO $$ooai:juser.fz-juelich.de:171757$$pVDB
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000171757 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)138790$$aForschungszentrum Jülich GmbH$$b3$$kFZJ
000171757 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130717$$aForschungszentrum Jülich GmbH$$b4$$kFZJ
000171757 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131022$$aForschungszentrum Jülich GmbH$$b5$$kFZJ
000171757 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130620$$aForschungszentrum Jülich GmbH$$b8$$kFZJ
000171757 9132_ $$0G:(DE-HGF)POF3-524$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$aDE-HGF$$bPOF III$$lKey Technologies$$vFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$x0
000171757 9131_ $$0G:(DE-HGF)POF2-424$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vExploratory materials and phenomena$$x0
000171757 9141_ $$y2014
000171757 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000171757 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x1
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000171757 980__ $$aI:(DE-Juel1)PGI-5-20110106
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