%0 Journal Article
%A Naboka, Michael
%A Subach, Sergey
%A Nefedov, Alexei
%A Tautz, Frank Stefan
%A Wöll, Christof
%T Direct Evidence of the Temperature-Induced Molecular Reorientation in Tetracene Thin Films on AlO$_{x}$ /Ni $_{3}$ Al(111)422
%J The journal of physical chemistry  / C
%V 118
%N 39
%@ 1932-7455
%C Washington, DC
%I Soc.
%M FZJ-2014-05602
%P 22678 - 22682
%D 2014
%X Control over the optical properties of the fluorescent organic layer plays a key role in the development of organic light-emitting diodes. A combination of near-edge X-ray absorption fine structure spectroscopy and X-ray photoelectron spectroscopy was used to study structural changes in thin films of tetracene on AlOx/Ni3Al(111). It is shown that upon deposition onto the cold (100 K) substrate, a monolayer of tetracene molecules adopts a disordered adsorption configuration with the molecular planes orientated almost parallel to the surface. Upon annealing at 280 K, the molecular packing changes and the tetracene units adopt a more upright orientation. The consequences of this orientational change for the luminescent properties of the molecular adlayer are discussed, in particular with regard to a quenching of the optical excitation by an electronic coupling of occupied and unoccupied molecular states to those of the metal substrate
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000342652000031
%R 10.1021/jp507773f
%U https://juser.fz-juelich.de/record/172053