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000017244 0247_ $$2DOI$$a10.1002/pssb.201100081
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000017244 084__ $$2WoS$$aPhysics, Condensed Matter
000017244 1001_ $$0P:(DE-Juel1)VDB86484$$aFrielinghaus, R.$$b0$$uFZJ
000017244 245__ $$aComprehensive characterization of an individual carbon nanotube transport device
000017244 260__ $$aWeinheim$$bWiley-VCH$$c2011
000017244 300__ $$a2660 - 2663
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000017244 440_0 $$04914$$aPHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS$$v248$$x0370-1972$$y11
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000017244 500__ $$aWe thank Rene Borowski for RIBE processing and the DFG (Forschergruppe FOR912) for financial support.
000017244 520__ $$aWe present a comprehensive characterization of an individual multiwalled carbon nanotube transport device combining electron microscopy and Raman spectroscopy with electrical measurements. Each method gives complementary information that mutually help to interpret each other. A sample design that allows for combining these investigation methods on individual carbon nanotube devices is introduced. This offers a direct correlation of transport features and shifts of Raman modes with structural properties as, e. g. the contact interface and the morphology of the nanotube. (C) 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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000017244 65320 $$2Author$$acarbon nanotubes
000017244 65320 $$2Author$$aRaman spectroscopy
000017244 65320 $$2Author$$aTEM
000017244 65320 $$2Author$$atransport
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000017244 7001_ $$0P:(DE-Juel1)VDB78497$$aGoß, K.$$b1$$uFZJ
000017244 7001_ $$0P:(DE-Juel1)128856$$aTrellenkamp, S.$$b2$$uFZJ
000017244 7001_ $$0P:(DE-Juel1)VDB4944$$aHouben, L.$$b3$$uFZJ
000017244 7001_ $$0P:(DE-Juel1)130948$$aSchneider, C. M.$$b4$$uFZJ
000017244 7001_ $$0P:(DE-Juel1)VDB14306$$aMeyer, C.$$b5$$uFZJ
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000017244 8567_ $$uhttp://dx.doi.org/10.1002/pssb.201100081
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