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@PHDTHESIS{Blab:172749,
      author       = {Blab, Marcus},
      title        = {{L}adungstransportmessungen an {S}i(111) {O}berflächen mit
                      einem {M}ultispitzen-{R}astertunnelmikroskop},
      volume       = {93},
      school       = {RWTH Aachen},
      type         = {Dissertation},
      address      = {Jülich},
      publisher    = {Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag},
      reportid     = {FZJ-2014-06192},
      isbn         = {978-3-89336-997-3},
      series       = {Schriften des Forschungszentrums Jülich. Reihe
                      Schlüsseltechnologien / Key Technologies},
      pages        = {XVI, 181 Seiten},
      year         = {2014},
      note         = {Dissertation, RWTH Aachen, 2014},
      abstract     = {This work concernes with the characterization and further
                      development of a multitip scanning tunneling microscope and
                      charge transport measurements on several silicon(Si)(111)
                      surfaces. Multitip-scanning tunneling microscopes are used
                      among others to determine the electrical conductance of
                      nanostructures. To get rid of the contact resistance, the
                      four-point method is used to measure the resistance of the
                      sample. Therefore four individual tips were used to make up
                      the multitip scanning tunneling microscope. Images of the
                      platin (Pt)(100) surface under ambient conditions show a
                      reconstructed surface, atomic steps and a drift of 1.6
                      Å/min after 18 hours. The development of a new
                      nanopositioner, the KoalaDrive, to approach the tip to the
                      sample, made the new multitip scanning tunneling microsope
                      ultra compact. However a setup of the KoalaDrive, which
                      works reliably in vacuum, had to be found. After a
                      successful characterization and further development of the
                      multitip scanning tunneling microscope, charge transport
                      measurements on several Si(111) surfaces were realised. The
                      conductance of the bismuthterminated Si(111)- $\sqrt{3}$ ×
                      $\sqrt{3}$ surface is comparable with a 3Å thick bismuth
                      layer. The conductivity of the bismuthterminated Si(111)-
                      $\sqrt{3}$ × $\sqrt{3}$ surface is (0.16 ± 0.07)
                      mS/$\Box$. The conductivity of the Si(111)-7×7 surface is
                      (4.0±0.1) μS/$\Box$ and therefore only 40 times smaller
                      than the conductivity of the bismuth- terminated silicon
                      surface. Additionally it will be shown that the Si(111)-7×7
                      surface is electrically strong decoupled from the bulk and
                      the main part of the current flows through the surface.
                      Furthermore the Si(111) surface will be hydrogen passivated
                      by using a chemical procedure. In doing this the surface
                      states were removed so that the bulk conductance of the
                      silicon sample could be measured. For a planned development
                      of a multitip scanning tunneling microscope in a multitip
                      atomic force microscopes the functionality of a
                      needle-sensor as a force detector will be varified. In
                      comparison to other sensors, the needle-sensor is very
                      compact and due to its geometry it would be optimal for
                      multitip atomic force microscopes. For positioning of all
                      four tips of the multitip atomic force microscope at one
                      location, the sensors have to be attached at an angle of
                      45$^{\circ}$ with respect to the surface. It becomes
                      apparent that the imaging of surfaces is more complicated
                      than using a sensor which is perpendicularly mounted to the
                      surface. ”Snap to contact” and eigenfrequencies of the
                      tip which are close to the eigenfrequency of the sensor
                      could be a possible explanation.},
      keywords     = {Dissertation (GND)},
      cin          = {PGI-3},
      cid          = {I:(DE-Juel1)PGI-3-20110106},
      pnm          = {142 - Controlling Spin-Based Phenomena (POF3-142)},
      pid          = {G:(DE-HGF)POF3-142},
      typ          = {PUB:(DE-HGF)3 / PUB:(DE-HGF)11},
      url          = {https://juser.fz-juelich.de/record/172749},
}