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@PHDTHESIS{Korte:172850,
author = {Korte, Stefan},
title = {{L}adungstransport durch {G}raphenschichtenund
{G}a{A}s-{N}anodrähte untersucht mit einem
{M}ultispitzen-{R}astertunnelmikroskop},
volume = {90},
school = {RWTH Aachen University},
type = {Dissertation},
address = {Jülich},
publisher = {Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag},
reportid = {FZJ-2014-06284},
isbn = {978-3-89336-990-4},
series = {Schriften des Forschungszentrums Jülich. Reihe
Schlüsseltechnologien/ Key Technologies},
pages = {96 S.},
year = {2014},
note = {Dissertation, RWTH Aachen University, 2014},
abstract = {This work describes the use of the combination of a
scanning electron microscope (SEM) and a multitip scanning
tunneling microscope (STM) with four tips as a nanoprober.
Electrical measurements on graphene layers and freestanding
gallium arsenide (GaAs) nanowires were conducted.
Four-probe-measurements are necessary to measure the
resisitvity of such one- and two-dimensional conductors. Due
to unknown voltage drops at contacts that carry currents,
additional contacts have to be employed for current-free
potential measurements. Therefore, the multitip scanning
tunneling microscope with its four individually controllable
tips has been upgraded with extended electronics, enabling
us to use it as a flexible nanoprober. Graphene layers on
insulating SiO$_{2}$ and hexagonal boron nitride (h-BN),
prepared by mechanical exfoliation, were contacted with the
multitip STM. Tunneling current could not be used as
feedback when approaching the first tip. Therefore, a
contrast change in the SEM image upon contacting a graphene
flake with a tip was used. Once contacted, flakes were
scanned by RTM and electrical measurements were conducted.
Graphene transferred to h-BN showed bubbles, wrinkles and
contaminations. Still, STM images of clean areas revealed a
moiré pattern, proving that the atomically thin graphene
lay flat on the atomically flat h-BN surface. Four point
measurements of these samples showed a poor conductivity of
1/$\sigma$ = 16$^{k \Omega} /box$ and a low field effect
mobility of $\mu$ = 300$^{cm^{2}}$/Vs. The reason for this
might be the contaminations from the transfer process, as
well as effects from prolonged irradiation with electrons
from the SEM. Freestanding p-doped GaAs nanowires, grown by
metal-organic vapor-phase-epitaxy in the
vapor-liquid-solid-growth mode, in a process with two
temperature steps, were contacted with the multitip STM.
Using three tips as well as the substrate as contacts, four
point measurements were performed. It showed that elastic
deformation of these flexible nanowires has no significant
influence on their conductivity. The high spatial resolution
of the combination of a SEM with a multitip STM made it
possible to record resistance profiles of freestanding
nanowires by performing four point measurements along a
nanowire. The main segment of the nanowires, grown at
400$^{\circ}$C for better crystal quality exhibits a
resisitivity of a few $^{k\Omega}$/$_{\mu m}$, in agreement
with literature values. The nanowire base, grown at
450$^{\circ}$C to facilitate better nucleation, shows an
increased resisitvity of several $^{M\Omega}$/$_{\mu m}$.
The resistance of the nanowire base is relevant especially
for future opto-electronical components based on
freestanding nanowires and thus has to be understood.
Comparing profiles of nanowires grown by an identical
process on different substrates showed that the substrate is
not the cause of the increased resistance. From the measured
resistivities the dopant concentrations, as well as the
thickness of the space charge layer at the surface of the
GaAs nanowires were calculated. The nanowire segments grown
at 400$^{\circ}$C have a dopant concentration of roughly
10$^{19}$cm$^{-3}$, those grown at 450$^{\circ}$C about 2
$\cdot$10$^{17}$ cm$^{-3}$. In the base the space charge
layer poses a considerable constriction to the conduction. A
qualitative explanation for the temperature dependence of
the dopant concentration is given.},
keywords = {Dissertation (GND)},
cin = {PGI-3},
cid = {I:(DE-Juel1)PGI-3-20110106},
pnm = {141 - Controlling Electron Charge-Based Phenomena
(POF3-141)},
pid = {G:(DE-HGF)POF3-141},
typ = {PUB:(DE-HGF)3 / PUB:(DE-HGF)11},
url = {https://juser.fz-juelich.de/record/172850},
}