TY  - CONF
AU  - Meier, Matthias
AU  - Paetzold, Ulrich W.
AU  - Ghosh, Michael
AU  - Erven, Rob van
TI  - Nano-imprint lithography for advanced light management conceptsin multi-junction solar cells
M1  - FZJ-2014-06482
PY  - 2014
T2  - IEEE Photovoltaic Specialists Conference
CY  - 9 Jun 2014 - 13 Jun 2014, Denver (USA)
Y2  - 9 Jun 2014 - 13 Jun 2014
M2  - Denver, USA
LB  - PUB:(DE-HGF)26
UR  - https://juser.fz-juelich.de/record/173069
ER  -