TY  - CONF
AU  - Lehnen, Stephan
AU  - Paetzold, Ulrich W.
AU  - Ermes, Markus
AU  - Bittkau, Karsten
AU  - Carius, Reinhard
TI  - Analysis of Light Propagation in Thin-Film Solar Cells by Dual-Probe Scanning Near-Field Optical Microscopy
M1  - FZJ-2014-06507
PY  - 2014
T2  - 40th IEEE Photovoltaic Specialist Conference
CY  - 8 Jun 2014 - 13 Jun 2014, Denver, CO (USA)
Y2  - 8 Jun 2014 - 13 Jun 2014
M2  - Denver, CO, USA
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/173094
ER  -