% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Patt:173139,
      author       = {Patt, M. and Wiemann, C. and Weber, N. and Escher, M. and
                      Gloskovskii, A. and Drube, W. and Merkel, M. and Schneider,
                      C. M.},
      title        = {{B}ulk sensitive hard x-ray photoemission electron
                      microscopy},
      journal      = {Review of scientific instruments},
      volume       = {85},
      number       = {11},
      issn         = {1089-7623},
      address      = {[S.l.]},
      publisher    = {American Institute of Physics},
      reportid     = {FZJ-2014-06552},
      pages        = {113704},
      year         = {2014},
      abstract     = {Hard x-ray photoelectron spectroscopy (HAXPES) has now
                      matured into a well-established technique as a bulk
                      sensitive probe of the electronic structure due to the
                      larger escape depth of the highly energetic electrons. In
                      order to enable HAXPES studies with high lateral resolution,
                      we have set up a dedicated energy-filtered hard x-ray
                      photoemission electron microscope (HAXPEEM) working with
                      electron kinetic energies up to 10 keV. It is based on the
                      NanoESCA design and also preserves the performance of the
                      instrument in the low and medium energy range. In this way,
                      spectromicroscopy can be performed from threshold to hard
                      x-ray photoemission. The high potential of the HAXPEEM
                      approach for the investigation of buried layers and
                      structures has been shown already on a layered and
                      structured SrTiO3 sample. Here, we present results of
                      experiments with test structures to elaborate the imaging
                      and spectroscopic performance of the instrument and show the
                      capabilities of the method to image bulk properties.
                      Additionally, we introduce a method to determine the
                      effective attenuation length of photoelectrons in a direct
                      photoemission experiment.© 2014 AIP Publishing LLC},
      cin          = {PGI-6 / JARA-FIT},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-6-20110106 / $I:(DE-82)080009_20140620$},
      pnm          = {422 - Spin-based and quantum information (POF2-422)},
      pid          = {G:(DE-HGF)POF2-422},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000345646000266},
      pubmed       = {25430117},
      doi          = {10.1063/1.4902141},
      url          = {https://juser.fz-juelich.de/record/173139},
}