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@ARTICLE{Dring:17393,
      author       = {Döring, S. and Schönbohm, F. and Berges, U. and
                      Schreiber, R. and Bürgler, D.E. and Schneider, C.M. and
                      Gorgoi, M. and Schäfers, F. and Papp, C. and Balke, B. and
                      Fadley, C.S. and Westphal, C.},
      title        = {{H}ard x-ray photoemission using standing-wave excitation
                      applied to the {M}g{O}/{F}e interface},
      journal      = {Physical review / B},
      volume       = {83},
      number       = {16},
      issn         = {1098-0121},
      address      = {College Park, Md.},
      publisher    = {APS},
      reportid     = {PreJuSER-17393},
      pages        = {165444},
      year         = {2011},
      note         = {The work was funded by the Land Nordrhein-Westfalen, the
                      NRW Research School of Synchrotron Radiation. The beam time
                      at BESSY was funded by the BMBF (FK 05 ES3XBA/5). We thank
                      the BESSY staff for their support. This work has also been
                      supported by the director, Office of Science, Office of
                      Basic Energy Sciences, Materials Sciences and Engineering
                      Division, of the US Department of Energy under Contract No.
                      DE-AC02-05CH11231, the Humboldt Foundation, and the
                      Helmholtz Association.},
      abstract     = {Many applications in electronics and spintronics rely on
                      interfaces, which are buried a few nanometers deep and thus
                      are hardly accessible in real devices except for invasive
                      techniques. Here, we report on hard x-ray photoemission
                      spectroscopy combined with the x-ray standing-wave technique
                      as a noninvasive method to access buried interfaces with a
                      depth resolution of a few A and enhanced interface
                      sensitivity. Within these experiments, the film thicknesses
                      and also the thicknesses of the intermixing layers are
                      determined. We extend the data analysis scheme previously
                      developed for soft x-rays to the hard x-ray regime and apply
                      the method to buried epitaxial Fe/MgO interfaces, which play
                      a crucial role in magnetic tunnel junctions and their
                      applications. It was found that there was no detectable
                      intermixing or reaction of the Fe and MgO layers at the
                      interface.},
      keywords     = {J (WoSType)},
      cin          = {PGI-6},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-6-20110106},
      pnm          = {Grundlagen für zukünftige Informationstechnologien},
      pid          = {G:(DE-Juel1)FUEK412},
      shelfmark    = {Physics, Condensed Matter},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000290115600009},
      doi          = {10.1103/PhysRevB.83.165444},
      url          = {https://juser.fz-juelich.de/record/17393},
}