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000017483 0247_ $$2DOI$$a10.1038/nmat3089
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000017483 084__ $$2WoS$$aChemistry, Physical
000017483 084__ $$2WoS$$aMaterials Science, Multidisciplinary
000017483 084__ $$2WoS$$aPhysics, Applied
000017483 084__ $$2WoS$$aPhysics, Condensed Matter
000017483 1001_ $$0P:(DE-Juel1)VDB102206$$aGray, A. X.$$b0$$uFZJ
000017483 245__ $$aProbing bulk electronic structure with hard X-ray angle-resolved photoemission
000017483 260__ $$aBasingstoke$$bNature Publishing Group$$c2011
000017483 300__ $$a759 - 764
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000017483 440_0 $$011903$$aNature Materials$$v10$$x1476-1122$$y10
000017483 500__ $$3POF3_Assignment on 2016-02-29
000017483 500__ $$aThe authors would like to thank O. D. Dubon (UC Berkeley) for providing the GaAs sample. The authors with LBNL affiliation acknowledge support from the Director, Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, of the US Department of Energy under contract number DE-AC02-05CH11231, for salary and travel support. The measurements were performed under the approval of NIMS Beamline Station (Proposal Nos. 2008A4906, 2008B4800, 2009A4906). This work was partially supported by the Nanotechnology Network Project, the Ministry of Education, Culture, Sports, Science and Technology (MEXT), Japan. Financial support by the Deutsche Forschungsgemeinschaft (FOR 1346, EB-154/20 and MI-1327/1) and the Bundesministerium fur Bildung und Forschung (05K10WMA) is also gratefully acknowledged.
000017483 520__ $$aTraditional ultraviolet/soft X-ray angle-resolved photoemission spectroscopy (ARPES) may in some cases be too strongly influenced by surface effects to be a useful probe of bulk electronic structure. Going to hard X-ray photon energies and thus larger electron inelastic mean-free paths should provide a more accurate picture of bulk electronic structure. We present experimental data for hard X-ray ARPES (HARPES) at energies of 3.2 and 6.0 keV. The systems discussed are W, as a model transition-metal system to illustrate basic principles, and GaAs, as a technologically-relevant material to illustrate the potential broad applicability of this new technique. We have investigated the effects of photon wave vector on wave vector conservation, and assessed methods for the removal of phonon-associated smearing of features and photoelectron diffraction effects. The experimental results are compared to free-electron final-state model calculations and to more precise one-step photoemission theory including matrix element effects.
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000017483 7001_ $$0P:(DE-Juel1)VDB102129$$aPapp, C.$$b1$$uFZJ
000017483 7001_ $$0P:(DE-Juel1)VDB102211$$aUeda, S.$$b2$$uFZJ
000017483 7001_ $$0P:(DE-Juel1)VDB71731$$aBalke, B.$$b3$$uFZJ
000017483 7001_ $$0P:(DE-Juel1)VDB102212$$aYamashita, Y.$$b4$$uFZJ
000017483 7001_ $$0P:(DE-Juel1)VDB83183$$aPlucinski, L.$$b5$$uFZJ
000017483 7001_ $$0P:(DE-Juel1)VDB64742$$aMinar, J.$$b6$$uFZJ
000017483 7001_ $$0P:(DE-Juel1)VDB83185$$aBraun, J.$$b7$$uFZJ
000017483 7001_ $$0P:(DE-Juel1)VDB102213$$aYlvisaker, E. R.$$b8$$uFZJ
000017483 7001_ $$0P:(DE-Juel1)130948$$aSchneider, C. M.$$b9$$uFZJ
000017483 7001_ $$0P:(DE-Juel1)VDB102214$$aPickett, W.   E.$$b10$$uFZJ
000017483 7001_ $$0P:(DE-Juel1)VDB2609$$aEbert, H.$$b11$$uFZJ
000017483 7001_ $$0P:(DE-Juel1)VDB90117$$aKobayashi, K.$$b12$$uFZJ
000017483 7001_ $$0P:(DE-Juel1)VDB101984$$aFadley, C. S.$$b13$$uFZJ
000017483 773__ $$0PERI:(DE-600)2088679-2$$a10.1038/nmat3089$$gVol. 10, p. 759 - 764$$p759 - 764$$q10<759 - 764$$tNature materials$$v10$$x1476-1122$$y2011
000017483 8567_ $$uhttp://dx.doi.org/10.1038/nmat3089
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