%0 Conference Paper
%A Ermes, Markus
%A Lehnen, Stephan
%A Bittkau, Karsten
%A Carius, Reinhard
%T Incorporating the influence of the scanning probe in rigorous optical simulations by fast post-processing methods
%M FZJ-2014-06935
%D 2014
%B Theory, Modelling and Computational Methods for Semiconductors
%C 22 Jan 2014 - 24 Jan 2014, Manchester (Great Britain)
Y2 22 Jan 2014 - 24 Jan 2014
M2 Manchester, Great Britain
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/185508