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000185646 037__ $$aFZJ-2014-07071
000185646 1001_ $$0P:(DE-Juel1)130677$$aGunkel, Felix$$b0$$eCorresponding Author$$ufzj
000185646 1112_ $$aInt. Workshop on Oxide Electronics$$cBolton Landing, NY$$d2014-09-28 - 2014-10-01$$gIWOE21$$wUSA
000185646 245__ $$aAnomalous transport at oxide interfaces: Detecting magnetism in the Hall effect in conducting NdGaO3/SrTiO3 heterostructures
000185646 260__ $$c2014
000185646 3367_ $$0PUB:(DE-HGF)6$$2PUB:(DE-HGF)$$aConference Presentation$$bconf$$mconf$$s1418913772_23016$$xOther
000185646 3367_ $$033$$2EndNote$$aConference Paper
000185646 3367_ $$2DataCite$$aOther
000185646 3367_ $$2ORCID$$aLECTURE_SPEECH
000185646 3367_ $$2DRIVER$$aconferenceObject
000185646 3367_ $$2BibTeX$$aINPROCEEDINGS
000185646 536__ $$0G:(DE-HGF)POF2-421$$a421 - Frontiers of charge based Electronics (POF2-421)$$cPOF2-421$$fPOF II$$x0
000185646 7001_ $$0P:(DE-HGF)0$$aKim, B.$$b1
000185646 7001_ $$0P:(DE-HGF)0$$aHarashima, S.$$b2
000185646 7001_ $$0P:(DE-Juel1)138790$$aJin, Lei$$b3$$ufzj
000185646 7001_ $$0P:(DE-Juel1)130717$$aHoffmann-Eifert, Susanne$$b4$$ufzj
000185646 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b5$$ufzj
000185646 7001_ $$0P:(DE-HGF)0$$aBell, C.$$b6
000185646 7001_ $$0P:(DE-HGF)0$$aHwang, H. Y.$$b7
000185646 7001_ $$0P:(DE-Juel1)130620$$aDittmann, Regina$$b8$$ufzj
000185646 773__ $$y2014
000185646 909CO $$ooai:juser.fz-juelich.de:185646$$pVDB
000185646 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130677$$aForschungszentrum Jülich GmbH$$b0$$kFZJ
000185646 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)138790$$aForschungszentrum Jülich GmbH$$b3$$kFZJ
000185646 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130717$$aForschungszentrum Jülich GmbH$$b4$$kFZJ
000185646 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131022$$aForschungszentrum Jülich GmbH$$b5$$kFZJ
000185646 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130620$$aForschungszentrum Jülich GmbH$$b8$$kFZJ
000185646 9132_ $$0G:(DE-HGF)POF3-523$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000185646 9131_ $$0G:(DE-HGF)POF2-421$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vFrontiers of charge based Electronics$$x0
000185646 9141_ $$y2014
000185646 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000185646 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x1
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000185646 980__ $$aI:(DE-Juel1)PGI-5-20110106
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000185646 981__ $$aI:(DE-Juel1)PGI-5-20110106