000186405 001__ 186405
000186405 005__ 20210129214903.0
000186405 0247_ $$2doi$$a10.1021/jp4105213
000186405 0247_ $$2ISSN$$a1932-7447
000186405 0247_ $$2ISSN$$a1932-7455
000186405 0247_ $$2WOS$$aWOS:000333578300022
000186405 037__ $$aFZJ-2015-00481
000186405 082__ $$a540
000186405 1001_ $$0P:(DE-HGF)0$$aBreinlich, Christian$$b0$$eCorresponding Author
000186405 245__ $$aScanning Tunneling Microscopy Investigation of Ultrathin Titanium Oxide Films Grown on Pt 3 Ti(111)
000186405 260__ $$aWashington, DC$$bSoc.$$c2014
000186405 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1421311219_12767
000186405 3367_ $$2DataCite$$aOutput Types/Journal article
000186405 3367_ $$00$$2EndNote$$aJournal Article
000186405 3367_ $$2BibTeX$$aARTICLE
000186405 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000186405 3367_ $$2DRIVER$$aarticle
000186405 520__ $$aOrdered ultrathin titanium oxide films have been produced under ultrahigh vacuum (UHV) conditions by oxidation of a Pt3Ti(111) single crystal at elevated temperatures. Depending on substrate temperature, oxygen dosage, and partial pressure, four different titania phases have been observed. All phases have been investigated by low-energy electron diffraction (LEED) and scanning tunneling microscopy (STM). Two commensurate phases with a rect-(6 × 3√3) and a hex-(7 × 7)R21.8° superstructure, respectively, are obtained at low oxygen pressures. Both structures form homogeneous films, which wet the complete surface and are stable against further annealing. At high oxygen partial pressures two incommensurate structures can be prepared. The first one contains several holes to release stress arising from the lattice mismatch between the oxide film and substrate. The second one shows a very rough surface morphology and is, like the other incommensurate phase, unstable against thermal treatment. The structures of the different phases are very similar to the structures found for the systems TiOx/Pt(111), VOx/Rh(111), and VOx/Pd(111), which have been described extensively in the literature.
000186405 536__ $$0G:(DE-HGF)POF2-421$$a421 - Frontiers of charge based Electronics (POF2-421)$$cPOF2-421$$fPOF II$$x0
000186405 588__ $$aDataset connected to CrossRef, juser.fz-juelich.de
000186405 7001_ $$0P:(DE-HGF)0$$aBuchholz, Maria$$b1
000186405 7001_ $$0P:(DE-Juel1)145323$$aMoors, Marco$$b2$$ufzj
000186405 7001_ $$0P:(DE-HGF)0$$aLe Moal, Séverine$$b3
000186405 7001_ $$0P:(DE-HGF)0$$aBecker, Conrad$$b4
000186405 7001_ $$0P:(DE-HGF)0$$aWandelt, Klaus$$b5
000186405 773__ $$0PERI:(DE-600)2256522-X$$a10.1021/jp4105213$$gVol. 118, no. 12, p. 6186 - 6192$$n12$$p6186 - 6192$$tThe @journal of physical chemistry <Washington, DC> / C$$v118$$x1932-7455$$y2014
000186405 8564_ $$uhttps://juser.fz-juelich.de/record/186405/files/FZJ-2015-00481.pdf$$yRestricted
000186405 909CO $$ooai:juser.fz-juelich.de:186405$$pVDB
000186405 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)145323$$aForschungszentrum Jülich GmbH$$b2$$kFZJ
000186405 9132_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000186405 9131_ $$0G:(DE-HGF)POF2-421$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vFrontiers of charge based Electronics$$x0
000186405 9141_ $$y2014
000186405 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000186405 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000186405 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000186405 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000186405 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000186405 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000186405 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000186405 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences
000186405 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF <  5
000186405 920__ $$lyes
000186405 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000186405 980__ $$ajournal
000186405 980__ $$aVDB
000186405 980__ $$aI:(DE-Juel1)PGI-7-20110106
000186405 980__ $$aUNRESTRICTED