%0 Journal Article
%A Tappertzhofen, Stefan
%A Linn, Eike
%A Bottger, Ulrich
%A Waser, R.
%A Valov, Ilia
%T Nanobattery Effect in RRAMs—Implications on Device Stability and Endurance 
%J IEEE electron device letters
%V 35
%N 2
%@ 1558-0563
%C New York, NY
%I IEEE
%M FZJ-2015-00484
%P 208 - 210
%D 2014
%X The impact of the recently discovered nanobattery effect on the switching, the endurance, and the retention of resistive random access memory devices is demonstrated. We show that the relaxation of the electromotive force voltage may lead to a shift of the resistance level for high resistive states, which is included into device modeling. Based on the extended memristive device model, which accounts for the nanobattery effects, endurance and retention problems can be explained.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000331377500020
%R 10.1109/LED.2013.2292113
%U https://juser.fz-juelich.de/record/186408