%0 Journal Article
%A Yan, Zilin
%A Guillon, Olivier
%A Martin, Christophe L.
%A Wang, Steve
%A Lee, Chul-Seung
%A Charlot, Frederic
%A Bouvard, Didier
%A Randall, Clive Alan
%T Correlative Studies on Sintering of Ni/BaTiO3 Multilayers Using X-ray Computed Nanotomographiy and FIB-SEM Nanotomography
%J Journal of the American Ceramic Society
%V 98
%N 4
%@ 0002-7820
%C Oxford [u.a.]
%I Wiley-Blackwell
%M FZJ-2015-00661
%P 1338-1346
%D 2015
%X Synchrotron X-ray computed nanotomography (nCT) and Focused Ion Beam–Scanning Electron Microscope nanotomography (FIB-nT) were used to characterize baked-out and sintered nickel (Ni) electrode–Multilayer Ceramic Capacitors. The three-dimensional microstructures obtained by two different tomography techniques were quantified and correlated. X-ray nCT is sufficient to reveal the pore characteristics, whereas the FIB-nT enables the particles in the initial packings to be identified. In the dielectric ceramic layers, pores preferentially orient horizontally in the layer and the regions near the Ni/BT interface are denser than the inner regions. This anisotropy is possibly caused by compressive stress induced during the heating stage.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000352635100045
%R 10.1111/jace.13416
%U https://juser.fz-juelich.de/record/186588