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000186588 1001_ $$0P:(DE-HGF)0$$aYan, Zilin$$b0$$eCorresponding Author
000186588 245__ $$aCorrelative Studies on Sintering of Ni/BaTiO3 Multilayers Using X-ray Computed Nanotomographiy and FIB-SEM Nanotomography
000186588 260__ $$aOxford [u.a.]$$bWiley-Blackwell$$c2015
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000186588 520__ $$aSynchrotron X-ray computed nanotomography (nCT) and Focused Ion Beam–Scanning Electron Microscope nanotomography (FIB-nT) were used to characterize baked-out and sintered nickel (Ni) electrode–Multilayer Ceramic Capacitors. The three-dimensional microstructures obtained by two different tomography techniques were quantified and correlated. X-ray nCT is sufficient to reveal the pore characteristics, whereas the FIB-nT enables the particles in the initial packings to be identified. In the dielectric ceramic layers, pores preferentially orient horizontally in the layer and the regions near the Ni/BT interface are denser than the inner regions. This anisotropy is possibly caused by compressive stress induced during the heating stage.
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000186588 7001_ $$0P:(DE-Juel1)161591$$aGuillon, Olivier$$b1$$eCorresponding Author
000186588 7001_ $$0P:(DE-HGF)0$$aMartin, Christophe L.$$b2
000186588 7001_ $$0P:(DE-HGF)0$$aWang, Steve$$b3
000186588 7001_ $$0P:(DE-HGF)0$$aLee, Chul-Seung$$b4
000186588 7001_ $$0P:(DE-HGF)0$$aCharlot, Frederic$$b5
000186588 7001_ $$0P:(DE-HGF)0$$aBouvard, Didier$$b6
000186588 7001_ $$0P:(DE-HGF)0$$aRandall, Clive Alan$$b7
000186588 773__ $$0PERI:(DE-600)2008170-4$$a10.1111/jace.13416$$gp. n/a - n/a$$n4$$p1338-1346$$tJournal of the American Ceramic Society$$v98$$x0002-7820$$y2015
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