TY  - JOUR
AU  - Yan, Zilin
AU  - Guillon, Olivier
AU  - Martin, Christophe L.
AU  - Wang, Steve
AU  - Lee, Chul-Seung
AU  - Charlot, Frederic
AU  - Bouvard, Didier
AU  - Randall, Clive Alan
TI  - Correlative Studies on Sintering of Ni/BaTiO3 Multilayers Using X-ray Computed Nanotomographiy and FIB-SEM Nanotomography
JO  - Journal of the American Ceramic Society
VL  - 98
IS  - 4
SN  - 0002-7820
CY  - Oxford [u.a.]
PB  - Wiley-Blackwell
M1  - FZJ-2015-00661
SP  - 1338-1346
PY  - 2015
AB  - Synchrotron X-ray computed nanotomography (nCT) and Focused Ion Beam–Scanning Electron Microscope nanotomography (FIB-nT) were used to characterize baked-out and sintered nickel (Ni) electrode–Multilayer Ceramic Capacitors. The three-dimensional microstructures obtained by two different tomography techniques were quantified and correlated. X-ray nCT is sufficient to reveal the pore characteristics, whereas the FIB-nT enables the particles in the initial packings to be identified. In the dielectric ceramic layers, pores preferentially orient horizontally in the layer and the regions near the Ni/BT interface are denser than the inner regions. This anisotropy is possibly caused by compressive stress induced during the heating stage.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000352635100045
DO  - DOI:10.1111/jace.13416
UR  - https://juser.fz-juelich.de/record/186588
ER  -