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@ARTICLE{Yan:186588,
author = {Yan, Zilin and Guillon, Olivier and Martin, Christophe L.
and Wang, Steve and Lee, Chul-Seung and Charlot, Frederic
and Bouvard, Didier and Randall, Clive Alan},
title = {{C}orrelative {S}tudies on {S}intering of {N}i/{B}a{T}i{O}3
{M}ultilayers {U}sing {X}-ray {C}omputed {N}anotomographiy
and {FIB}-{SEM} {N}anotomography},
journal = {Journal of the American Ceramic Society},
volume = {98},
number = {4},
issn = {0002-7820},
address = {Oxford [u.a.]},
publisher = {Wiley-Blackwell},
reportid = {FZJ-2015-00661},
pages = {1338-1346},
year = {2015},
abstract = {Synchrotron X-ray computed nanotomography (nCT) and Focused
Ion Beam–Scanning Electron Microscope nanotomography
(FIB-nT) were used to characterize baked-out and sintered
nickel (Ni) electrode–Multilayer Ceramic Capacitors. The
three-dimensional microstructures obtained by two different
tomography techniques were quantified and correlated. X-ray
nCT is sufficient to reveal the pore characteristics,
whereas the FIB-nT enables the particles in the initial
packings to be identified. In the dielectric ceramic layers,
pores preferentially orient horizontally in the layer and
the regions near the Ni/BT interface are denser than the
inner regions. This anisotropy is possibly caused by
compressive stress induced during the heating stage.},
cin = {IEK-1 / JARA-ENERGY},
ddc = {660},
cid = {I:(DE-Juel1)IEK-1-20101013 / $I:(DE-82)080011_20140620$},
pnm = {899 - ohne Topic (POF3-899)},
pid = {G:(DE-HGF)POF3-899},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000352635100045},
doi = {10.1111/jace.13416},
url = {https://juser.fz-juelich.de/record/186588},
}