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| Home > Publications database > Correlative Studies on Sintering of Ni/BaTiO3 Multilayers Using X-ray Computed Nanotomographiy and FIB-SEM Nanotomography > print |
| Home > Publications database > Correlative Studies on Sintering of Ni/BaTiO3 Multilayers Using X-ray Computed Nanotomographiy and FIB-SEM Nanotomography > print |
| 001 | 186588 | ||
| 005 | 20240711085557.0 | ||
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| 100 | 1 | _ | |a Yan, Zilin |0 P:(DE-HGF)0 |b 0 |e Corresponding Author |
| 245 | _ | _ | |a Correlative Studies on Sintering of Ni/BaTiO3 Multilayers Using X-ray Computed Nanotomographiy and FIB-SEM Nanotomography |
| 260 | _ | _ | |a Oxford [u.a.] |c 2015 |b Wiley-Blackwell |
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| 520 | _ | _ | |a Synchrotron X-ray computed nanotomography (nCT) and Focused Ion Beam–Scanning Electron Microscope nanotomography (FIB-nT) were used to characterize baked-out and sintered nickel (Ni) electrode–Multilayer Ceramic Capacitors. The three-dimensional microstructures obtained by two different tomography techniques were quantified and correlated. X-ray nCT is sufficient to reveal the pore characteristics, whereas the FIB-nT enables the particles in the initial packings to be identified. In the dielectric ceramic layers, pores preferentially orient horizontally in the layer and the regions near the Ni/BT interface are denser than the inner regions. This anisotropy is possibly caused by compressive stress induced during the heating stage. |
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| 700 | 1 | _ | |a Guillon, Olivier |0 P:(DE-Juel1)161591 |b 1 |e Corresponding Author |
| 700 | 1 | _ | |a Martin, Christophe L. |0 P:(DE-HGF)0 |b 2 |
| 700 | 1 | _ | |a Wang, Steve |0 P:(DE-HGF)0 |b 3 |
| 700 | 1 | _ | |a Lee, Chul-Seung |0 P:(DE-HGF)0 |b 4 |
| 700 | 1 | _ | |a Charlot, Frederic |0 P:(DE-HGF)0 |b 5 |
| 700 | 1 | _ | |a Bouvard, Didier |0 P:(DE-HGF)0 |b 6 |
| 700 | 1 | _ | |a Randall, Clive Alan |0 P:(DE-HGF)0 |b 7 |
| 773 | _ | _ | |a 10.1111/jace.13416 |g p. n/a - n/a |0 PERI:(DE-600)2008170-4 |n 4 |p 1338-1346 |t Journal of the American Ceramic Society |v 98 |y 2015 |x 0002-7820 |
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