000018713 001__ 18713
000018713 005__ 20180208215820.0
000018713 0247_ $$2pmid$$apmid:22128982
000018713 0247_ $$2DOI$$a10.1063/1.3657135
000018713 0247_ $$2WOS$$aWOS:000297941100025
000018713 0247_ $$2Handle$$a2128/7369
000018713 037__ $$aPreJuSER-18713
000018713 041__ $$aeng
000018713 082__ $$a530
000018713 084__ $$2WoS$$aInstruments & Instrumentation
000018713 084__ $$2WoS$$aPhysics, Applied
000018713 1001_ $$0P:(DE-HGF)0$$aFlöhr, K.$$b0
000018713 245__ $$aManipulating InAs nanowires with submicrometer precision
000018713 260__ $$a[S.l.]$$bAmerican Institute of Physics$$c2011
000018713 300__ $$a113705
000018713 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article
000018713 3367_ $$2DataCite$$aOutput Types/Journal article
000018713 3367_ $$00$$2EndNote$$aJournal Article
000018713 3367_ $$2BibTeX$$aARTICLE
000018713 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000018713 3367_ $$2DRIVER$$aarticle
000018713 440_0 $$05309$$aReview of Scientific Instruments$$v82$$x0034-6748$$y11
000018713 500__ $$3POF3_Assignment on 2016-02-29
000018713 500__ $$aWe thank Eva Maynicke, Onder Gul, Martin Raux, and Christian Blomers for technical assistance and acknowledge financial support by the excellence initiative of the German federal government.
000018713 520__ $$aInAs nanowires are grown epitaxially by catalyst-free metal organic vapor phase epitaxy and are subsequently positioned with a lateral accuracy of less than 1 μm using simple adhesion forces between the nanowires and an indium tip. The technique, requiring only an optical microscope, is used to place individual nanowires onto the corner of a cleaved-edge wafer as well as across predefined holes in Si(3)N(4) membranes. The precision of the method is limited by the stability of the micromanipulators and the precision of the optical microscope.
000018713 536__ $$0G:(DE-Juel1)FUEK412$$2G:(DE-HGF)$$aGrundlagen für zukünftige Informationstechnologien$$cP42$$x0
000018713 588__ $$aDataset connected to Web of Science, Pubmed
000018713 650_7 $$2WoSType$$aJ
000018713 7001_ $$0P:(DE-HGF)0$$aLiebmann, M.$$b1
000018713 7001_ $$0P:(DE-Juel1)VDB86963$$aSladek, K.$$b2$$uFZJ
000018713 7001_ $$0P:(DE-Juel1)VDB103407$$aGünel, H.Y.$$b3$$uFZJ
000018713 7001_ $$0P:(DE-Juel1)VDB86484$$aFrielinghaus, R.$$b4$$uFZJ
000018713 7001_ $$0P:(DE-Juel1)VDB102327$$aHaas, F.$$b5$$uFZJ
000018713 7001_ $$0P:(DE-Juel1)VDB14306$$aMeyer, C.$$b6$$uFZJ
000018713 7001_ $$0P:(DE-Juel1)125593$$aHardtdegen, H.$$b7$$uFZJ
000018713 7001_ $$0P:(DE-Juel1)128634$$aSchäpers, Th.$$b8$$uFZJ
000018713 7001_ $$0P:(DE-Juel1)125588$$aGrützmacher, D.$$b9$$uFZJ
000018713 7001_ $$0P:(DE-HGF)0$$aMorgenstern, M.$$b10
000018713 773__ $$0PERI:(DE-600)1472905-2$$a10.1063/1.3657135$$gVol. 82, p. 113705$$p113705$$q82<113705$$tReview of scientific instruments$$v82$$x0034-6748$$y2011
000018713 8567_ $$uhttp://dx.doi.org/10.1063/1.3657135
000018713 8564_ $$uhttps://juser.fz-juelich.de/record/18713/files/FZJ-18713.pdf$$yPublished under German "Allianz" Licensing conditions on 2011-11-16. Available in OpenAccess from 2011-11-16$$zPublished final document.
000018713 8564_ $$uhttps://juser.fz-juelich.de/record/18713/files/FZJ-18713.jpg?subformat=icon-1440$$xicon-1440
000018713 8564_ $$uhttps://juser.fz-juelich.de/record/18713/files/FZJ-18713.jpg?subformat=icon-180$$xicon-180
000018713 8564_ $$uhttps://juser.fz-juelich.de/record/18713/files/FZJ-18713.jpg?subformat=icon-640$$xicon-640
000018713 909CO $$ooai:juser.fz-juelich.de:18713$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000018713 9131_ $$0G:(DE-Juel1)FUEK412$$bSchlüsseltechnologien$$kP42$$lGrundlagen für zukünftige Informationstechnologien (FIT)$$vGrundlagen für zukünftige Informationstechnologien$$x0
000018713 9132_ $$0G:(DE-HGF)POF3-529H$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vAddenda$$x0
000018713 9141_ $$y2011
000018713 915__ $$0StatID:(DE-HGF)0010$$aJCR/ISI refereed
000018713 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000018713 915__ $$0StatID:(DE-HGF)0520$$2StatID$$aAllianz-OA
000018713 9201_ $$0I:(DE-Juel1)PGI-9-20110106$$gPGI$$kPGI-9$$lHalbleiter-Nanoelektronik$$x0
000018713 9201_ $$0I:(DE-82)080009_20140620$$gJARA$$kJARA-FIT$$lJülich-Aachen Research Alliance - Fundamentals of Future Information Technology$$x1
000018713 9201_ $$0I:(DE-Juel1)PGI-6-20110106$$gPGI$$kPGI-6$$lElektronische Eigenschaften$$x2
000018713 970__ $$aVDB:(DE-Juel1)133401
000018713 9801_ $$aFullTexts
000018713 980__ $$aVDB
000018713 980__ $$aConvertedRecord
000018713 980__ $$ajournal
000018713 980__ $$aI:(DE-Juel1)PGI-9-20110106
000018713 980__ $$aI:(DE-82)080009_20140620
000018713 980__ $$aI:(DE-Juel1)PGI-6-20110106
000018713 980__ $$aUNRESTRICTED
000018713 980__ $$aJUWEL
000018713 980__ $$aFullTexts
000018713 981__ $$aI:(DE-Juel1)PGI-6-20110106
000018713 981__ $$aI:(DE-Juel1)VDB881