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@ARTICLE{Boothroyd:187279,
      author       = {Boothroyd, Christopher Brian and Moreno, M. S. and Duchamp,
                      Martial and Kovacs, Andras and Monge, N. and Morales, G. M.
                      and Barbero, C. A. and Dunin-Borkowski, Rafal},
      title        = {{A}tomic resolution imaging and spectroscopy of barium
                      atoms and functional groups on graphene oxide},
      journal      = {Ultramicroscopy},
      volume       = {145},
      issn         = {0304-3991},
      address      = {Amsterdam},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2015-00952},
      pages        = {66-73},
      year         = {2014},
      abstract     = {We present an atomic resolution transmission electron
                      microscopy (TEM) and scanning TEM (STEM) study of the local
                      structure and composition of graphene oxide modified with
                      Ba2+. In our experiments, which are carried out at 80 kV,
                      the acquisition of contamination-free high-resolution STEM
                      images is only possible while heating the sample above 400
                      °C using a highly stable heating holder. Ba atoms are
                      identified spectroscopically in electron energy-loss
                      spectrum images taken at 800 °C and are associated with
                      bright contrast in high-angle annular dark-field STEM
                      images. The spectrum images also show that Ca and O occur
                      together and that Ba is not associated with a significant
                      concentration of O. The electron dose used for spectrum
                      imaging results in beam damage to the specimen, even at
                      elevated temperature. It is also possible to identify Ba
                      atoms in high-resolution TEM images acquired using shorter
                      exposure times at room temperature, thereby allowing the
                      structure of graphene oxide to be studied using
                      complementary TEM and STEM techniques over a wide range of
                      temperatures.},
      cin          = {PGI-5},
      ddc          = {570},
      cid          = {I:(DE-Juel1)PGI-5-20110106},
      pnm          = {42G - Peter Grünberg-Centre (PG-C) (POF2-42G41)},
      pid          = {G:(DE-HGF)POF2-42G41},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000340838100009},
      doi          = {10.1016/j.ultramic.2014.03.004},
      url          = {https://juser.fz-juelich.de/record/187279},
}