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@ARTICLE{Massabuau:187359,
author = {Massabuau, F. C.-P. and Davies, M. J. and Oehler, F. and
Pamenter, S. K. and Thrush, E. J. and Kappers, M. J. and
Kovacs, Andras and Williams, T. and Hopkins, M. A. and
Humphrey, C. J. and Dawson, P. and Dunin-Borkowski, Rafal
and Etheridge, J. and Allsopp, D. W. E. and Oliver, R. A.},
title = {{T}he impact of trench defects in {I}n{G}a{N}/{G}a{N} light
emitting diodes and implications for the "green gap"
problem},
journal = {Applied physics letters},
volume = {105},
issn = {0003-6951},
address = {Melville, NY},
publisher = {American Inst. of Physics},
reportid = {FZJ-2015-01030},
pages = {112110-1},
year = {2014},
abstract = {The impact of trench defects in blue InGaN/GaN light
emitting diodes (LEDs) has been investigated. Two mechanisms
responsible for the structural degradation of the multiple
quantum well (MQW) active region were identified. It was
found that during the growth of the p-type GaN capping
layer, loss of part of the active region enclosed within a
trench defect occurred, affecting the top-most QWs in the
MQW stack. Indium platelets and voids were also found to
form preferentially at the bottom of the MQW stack. The
presence of high densities of trench defects in the LEDs was
found to relate to a significant reduction in
photoluminescence and electroluminescence emission
efficiency, for a range of excitation power densities and
drive currents. This reduction in emission efficiency was
attributed to an increase in the density of non-radiative
recombination centres within the MQW stack, believed to be
associated with the stacking mismatch boundaries which form
part of the sub-surface structure of the trench defects.
Investigation of the surface of green-emitting QW structures
found a two decade increase in the density of trench
defects, compared to its blue-emitting counterpart,
suggesting that the efficiency of green-emitting LEDs may be
strongly affected by the presence of these defects. Our
results are therefore consistent with a model that the
“green gap” problem might relate to localized strain
relaxation occurring through defects.},
cin = {PGI-5},
ddc = {530},
cid = {I:(DE-Juel1)PGI-5-20110106},
pnm = {42G - Peter Grünberg-Centre (PG-C) (POF2-42G41)},
pid = {G:(DE-HGF)POF2-42G41},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000342995800045},
doi = {10.1063/1.4896279},
url = {https://juser.fz-juelich.de/record/187359},
}