% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Rossouw:187364,
      author       = {Rossouw, Chris J. and Dwyer, Christian and Katz-Boon, Hadas
                      and Etheridge, Joanne},
      title        = {{C}hanneling contrast analysis of lattice images:
                      {C}onditions for probe-insensitive {STEM}},
      journal      = {Ultramicroscopy},
      volume       = {136},
      issn         = {0304-3991},
      address      = {Amsterdam},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2015-01035},
      pages        = {216-223},
      year         = {2014},
      abstract     = {Quantitative analysis of lattice resolved images generated
                      by scanning transmission electron microscopy (STEM) requires
                      specification of probe characteristics, such as defocus,
                      aberration and source distribution. In this paper we show
                      that knowledge of such characteristics is unnecessary for
                      quantitative interpretation, if the signal is integrated
                      over a unit cell. Such a condition, whether the result of
                      experimental setup or post-processing of lattice resolved
                      images, reduces the intensity distribution to that of
                      channelling contrast, where the signal for plane wave
                      incidence is averaged over the angular range of the probe,
                      and the result is independent of the probe characteristics.
                      We use a Bloch wave model to show analytically how this
                      applies to all forms of STEM imaging, such as that formed by
                      annular dark field or backscatter detection, as well as
                      characteristic X-ray fluorescence or electron energy loss.
                      As a specific example, we consider how the signal from an
                      annular dark field detector can be used to determine
                      specimen thickness via a transfer curve for the zone axis
                      and scattering geometries employed. This method has
                      advantages over matching lattice images with calculations
                      since these are sensitive to probe coherence and aberration,
                      and saturation of the on-column intensity is approached more
                      rapidly.},
      cin          = {PGI-5},
      ddc          = {570},
      cid          = {I:(DE-Juel1)PGI-5-20110106},
      pnm          = {42G - Peter Grünberg-Centre (PG-C) (POF2-42G41)},
      pid          = {G:(DE-HGF)POF2-42G41},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000327884700028},
      doi          = {10.1016/j.ultramic.2013.10.005},
      url          = {https://juser.fz-juelich.de/record/187364},
}