TY  - JOUR
AU  - Desmarais, J.
AU  - Ihlefeld, J.F.
AU  - Heeg, T.
AU  - Schubert, J.
AU  - Schlom, D.G.
AU  - Huey, B.D.
TI  - Mapping and statistics of ferroelectric domain boundary angles and types
JO  - Applied physics letters
VL  - 99
SN  - 0003-6951
CY  - Melville, NY
PB  - American Institute of Physics
M1  - PreJuSER-18764
SP  - 162902
PY  - 2011
N1  - BDH and JD recognize support from the Department of Energy, Grant No. DE-SC-0005037. JFI, TH, and DGS were supported by the Army Research Office, Grant No. W911NF-08-2-0032. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy's National Nuclear Security Administration, Contract No. DE-AC04-94AL85000.
AB  - Ferroelectric domain orientations have been mapped using piezo-force microscopy, allowing the calculation and statistical analysis of interfacial polarization angles, the head-to-tail or head-to-head configuration, and any cross-coupling terms. Within 1 mu m(2) of an epitaxial (001)(p)-oriented BiFeO3 film, there are >40 mu m of linear domain boundary based on over 500 interfaces. 71 degrees domain walls dominate the interfacial polarization angles, with a 2:1 preference for uncharged head-to-tail versus charged head-to-head boundary types. This mapping technique offers a unique perspective on domain boundary distributions, important for ferroelectric and multiferroic applications where domain wall parameters are critical. (C) 2011 American Institute of Physics. [doi:10.1063/1.3643155]
KW  - J (WoSType)
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000296517600058
DO  - DOI:10.1063/1.3643155
UR  - https://juser.fz-juelich.de/record/18764
ER  -