TY  - JOUR
AU  - Moulin, Etienne
AU  - Paetzold, Ulrich W.
AU  - Pieters, Bart
AU  - Reetz, Wilfried
AU  - Carius, Reinhard
TI  - Plasmon-induced photoexcitation of “hot” electrons and “hot” holes in amorphous silicon photosensitive devices containing silver nanoparticles
JO  - Journal of applied physics
VL  - 113
IS  - 14
SN  - 0021-8979
CY  - Melville, NY
PB  - American Inst. of Physics
M1  - FZJ-2015-02377
SP  - 144501 
PY  - 2013
AB  - We report on a plasmon-induced photocurrent in photosensitive devices based on hydrogenated amorphous silicon (a-Si:H) containing silver nanoparticles (NPs). The photocurrent is measured in a spectral region corresponding to optical transitions below the band gap of a-Si:H. Photoexcitation of “hot” electrons in the NPs or in defect states present in the vicinity of the NPs, resulting from plasmon decay in the NPs, is often cited as being responsible for this effect. In this study, we demonstrate that plasmon induced photogeneration of “hot” holes is also able to contribute to a photocurrent. A bifacial symmetrical transparent device was prepared in order to compare the internal quantum efficiency of both processes, the first based on the photogeneration of “hot” electrons and the second based on the photogeneration of “hot” holes.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000318250600074
DO  - DOI:10.1063/1.4795509
UR  - https://juser.fz-juelich.de/record/189183
ER  -