TY  - JOUR
AU  - Remes, Zdenek
AU  - Holovsky, Jakub
AU  - Purkrt, Adam
AU  - Izak, Tibor
AU  - Poruba, Ales
AU  - Vanecek, Milan
AU  - Dagkaldiran, Ümit
AU  - Yates, Heather M.
AU  - Evans, Philip
AU  - Sheel, David W.
TI  - Optical absorption losses in metal layers used in thin film solar cells
JO  - Physica status solidi / A
VL  - 207
IS  - 9
SN  - 1862-6300
CY  - Weinheim
PB  - Wiley-VCH
M1  - FZJ-2015-02389
SP  - 2170 - 2173
PY  - 2010
AB  - We apply optical transmittance and reflectance spectroscopy, photothermal deflection spectroscopy (PDS) and laser calorimetry (LC) to evaluate optical absorption losses at rough interface between thin conductive oxide (TCO) and metal films used as backreflectors and electrical contacts in thin film solar cells. The paper proposes a simple method how to model the dielectric function of rough metal layers used in thin film solar cells. We show that the rough metal layer optically behaves as a semi-infinite layer with modified dielectric function calculated by the Landau–Lifshitz–Looyenga (LLL) model from the dielectric function of a smooth metal, the dielectric function of TCO and just one free parameter that needs to be found by fitting the total optical absorptance. This approach can be used to simplify the modelling of the optical properties of thin film solar cells.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000282766100031
DO  - DOI:10.1002/pssa.200925432
UR  - https://juser.fz-juelich.de/record/189198
ER  -