000189414 001__ 189414
000189414 005__ 20240610121206.0
000189414 0247_ $$2doi$$a10.1038/srep06975
000189414 0247_ $$2WOS$$aWOS:000344759200002
000189414 0247_ $$2Handle$$a2128/9096
000189414 037__ $$aFZJ-2015-02581
000189414 082__ $$a000
000189414 1001_ $$0P:(DE-HGF)0$$aMarchewka, Astrid$$b0
000189414 245__ $$aDetermination of the electrostatic potential distribution in Pt/Fe:SrTiO$_{3}$/Nb:SrTiO$_{3}$ thin-film structures by electron holography
000189414 260__ $$aLondon$$bNature Publishing Group$$c2014
000189414 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1429020270_26846
000189414 3367_ $$2DataCite$$aOutput Types/Journal article
000189414 3367_ $$00$$2EndNote$$aJournal Article
000189414 3367_ $$2BibTeX$$aARTICLE
000189414 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000189414 3367_ $$2DRIVER$$aarticle
000189414 520__ $$aWe determined the electrostatic potential distribution in pristine Pt/Fe:SrTiO3/Nb:SrTiO3 structures by electron holography experiments, revealing the existence of a depletion layer extending into the Nb-doped bottom electrode. Simulations of potential profiles in metal-insulator-metal structures were conducted assuming different types and distributions of dopants. It is found that the presence of acceptor-type dopant concentrations at the Fe:SrTiO3/Nb:SrTiO3 interface with a donor-doped insulating layer provides a good match to the measured profile. Such acceptor-type interface concentrations may be associated with Sr vacancies on the Nb:SrTiO3 side of the bottom interface.
000189414 536__ $$0G:(DE-HGF)POF2-42G41$$a42G - Peter Grünberg-Centre (PG-C) (POF2-42G41)$$cPOF2-42G41$$fPOF II$$x0
000189414 588__ $$aDataset connected to CrossRef, juser.fz-juelich.de
000189414 7001_ $$0P:(DE-HGF)0$$aCooper, David$$b1
000189414 7001_ $$0P:(DE-Juel1)138081$$aLenser, Christian$$b2$$ufzj
000189414 7001_ $$0P:(DE-Juel1)158062$$aMenzel, Stephan$$b3$$eCorresponding Author$$ufzj
000189414 7001_ $$0P:(DE-Juel1)145710$$aDu, Hongchu$$b4$$ufzj
000189414 7001_ $$0P:(DE-Juel1)130620$$aDittmann, Regina$$b5$$ufzj
000189414 7001_ $$0P:(DE-Juel1)144121$$aDunin-Borkowski, Rafal$$b6$$ufzj
000189414 7001_ $$0P:(DE-Juel1)131022$$aWaser, R.$$b7$$ufzj
000189414 773__ $$0PERI:(DE-600)2615211-3$$a10.1038/srep06975$$gVol. 4, p. 6975 -$$p6975 $$tScientific reports$$v4$$x2045-2322$$y2014
000189414 8564_ $$uhttps://juser.fz-juelich.de/record/189414/files/srep06975.pdf$$yOpenAccess
000189414 8564_ $$uhttps://juser.fz-juelich.de/record/189414/files/srep06975.pdf?subformat=pdfa$$xpdfa$$yOpenAccess
000189414 909CO $$ooai:juser.fz-juelich.de:189414$$pdnbdelivery$$pVDB$$pdriver$$popen_access$$popenaire
000189414 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)138081$$aForschungszentrum Jülich GmbH$$b2$$kFZJ
000189414 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)158062$$aForschungszentrum Jülich GmbH$$b3$$kFZJ
000189414 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)145710$$aForschungszentrum Jülich GmbH$$b4$$kFZJ
000189414 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)130620$$aForschungszentrum Jülich GmbH$$b5$$kFZJ
000189414 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)144121$$aForschungszentrum Jülich GmbH$$b6$$kFZJ
000189414 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)131022$$aForschungszentrum Jülich GmbH$$b7$$kFZJ
000189414 9132_ $$0G:(DE-HGF)POF3-143$$1G:(DE-HGF)POF3-140$$2G:(DE-HGF)POF3-100$$aDE-HGF$$bForschungsbereich Energie$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Configuration-Based Phenomena$$x0
000189414 9131_ $$0G:(DE-HGF)POF2-42G41$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$3G:(DE-HGF)POF2$$4G:(DE-HGF)POF$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen zukünftiger Informationstechnologien$$vPeter Grünberg-Centre (PG-C)$$x0
000189414 9141_ $$y2014
000189414 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000189414 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000189414 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000189414 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000189414 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000189414 915__ $$0StatID:(DE-HGF)0310$$2StatID$$aDBCoverage$$bNCBI Molecular Biology Database
000189414 915__ $$0StatID:(DE-HGF)1040$$2StatID$$aDBCoverage$$bZoological Record
000189414 915__ $$0StatID:(DE-HGF)1050$$2StatID$$aDBCoverage$$bBIOSIS Previews
000189414 915__ $$0StatID:(DE-HGF)9905$$2StatID$$aIF >= 5
000189414 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000189414 920__ $$lyes
000189414 9201_ $$0I:(DE-Juel1)PGI-5-20110106$$kPGI-5$$lMikrostrukturforschung$$x0
000189414 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x1
000189414 9801_ $$aFullTexts
000189414 980__ $$ajournal
000189414 980__ $$aVDB
000189414 980__ $$aUNRESTRICTED
000189414 980__ $$aI:(DE-Juel1)PGI-5-20110106
000189414 980__ $$aI:(DE-Juel1)PGI-7-20110106
000189414 981__ $$aI:(DE-Juel1)ER-C-1-20170209
000189414 981__ $$aI:(DE-Juel1)PGI-7-20110106