%0 Conference Paper
%A Houben, Lothar
%A Luysberg, Martina
%A Barthel, Juri
%A Mayer, Joachim
%A Dunin-Borkowski, Rafal
%T Low-voltage and energy-filtered chromatic aberration-corrected high-resolution TEM on the PICO instrument
%N IT-2-O-2644
%M FZJ-2015-02893
%M IT-2-O-2644
%P .
%D 2014
%B Proceedings of the 18th International Microscopy Congress
%C 7 Sep 2014 - 12 Sep 2014, Prague (Czech Republic)
Y2 7 Sep 2014 - 12 Sep 2014
M2 Prague, Czech Republic
%F PUB:(DE-HGF)8 ; PUB:(DE-HGF)15
%9 Contribution to a conference proceedingsInternal Report
%U https://juser.fz-juelich.de/record/189924