TY  - CONF
AU  - Houben, Lothar
AU  - Luysberg, Martina
AU  - Barthel, Juri
AU  - Mayer, Joachim
AU  - Dunin-Borkowski, Rafal
TI  - Low-voltage and energy-filtered chromatic aberration-corrected high-resolution TEM on the PICO instrument
IS  - IT-2-O-2644
M1  - FZJ-2015-02893
M1  - IT-2-O-2644
SP  - .
PY  - 2014
T2  - Proceedings of the 18th International Microscopy Congress
CY  - 7 Sep 2014 - 12 Sep 2014, Prague (Czech Republic)
Y2  - 7 Sep 2014 - 12 Sep 2014
M2  - Prague, Czech Republic
LB  - PUB:(DE-HGF)8 ; PUB:(DE-HGF)15
UR  - https://juser.fz-juelich.de/record/189924
ER  -