TY  - CONF
AU  - Cooper, D.
AU  - Rouvière
AU  - Dunin-Borkowski, Rafal
TI  - Field mapping in semiconductors by off-axis electron holography: from devises to graphene and single dopant atoms
JO  - Microscopy and microanalysis
VL  - 20
IS  - S3
SN  - 1431-9276
CY  - New York, NY
PB  - Cambridge University Press
M1  - FZJ-2015-02903
SP  - 254-255
PY  - 2014
T2  - Paper presented at Microscopy and Microanalysis
CY  - 3 Aug 2014 - 7 Aug 2014, Hartford (CT)
Y2  - 3 Aug 2014 - 7 Aug 2014
M2  - Hartford, CT
LB  - PUB:(DE-HGF)8 ; PUB:(DE-HGF)16
DO  - DOI:10.1017/S1431927614002992
UR  - https://juser.fz-juelich.de/record/189934
ER  -