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@INPROCEEDINGS{Cooper:189934,
      author       = {Cooper, D. and Rouvière and Dunin-Borkowski, Rafal},
      title        = {{F}ield mapping in semiconductors by off-axis electron
                      holography: from devises to graphene and single dopant
                      atoms},
      journal      = {Microscopy and microanalysis},
      volume       = {20},
      number       = {S3},
      issn         = {1431-9276},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2015-02903},
      pages        = {254-255},
      year         = {2014},
      month         = {Aug},
      date          = {2014-08-03},
      organization  = {Paper presented at Microscopy and
                       Microanalysis, Hartford (CT), 3 Aug
                       2014 - 7 Aug 2014},
      cin          = {PGI-5},
      ddc          = {570},
      cid          = {I:(DE-Juel1)PGI-5-20110106},
      pnm          = {42G - Peter Grünberg-Centre (PG-C) (POF2-42G41)},
      pid          = {G:(DE-HGF)POF2-42G41},
      typ          = {PUB:(DE-HGF)8 / PUB:(DE-HGF)16},
      doi          = {10.1017/S1431927614002992},
      url          = {https://juser.fz-juelich.de/record/189934},
}