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@PHDTHESIS{Bttler:190090,
author = {Böttler, Wanjiao},
title = {{L}ight scattering and trapping in thin film silicon solar
cells with an n-i-p configuration},
volume = {245},
school = {RWTH Aachen},
type = {Dr.},
address = {Jülich},
publisher = {Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag},
reportid = {FZJ-2015-03049},
isbn = {978-3-95806-023-4},
series = {Schriften des Forschungszentrums Jülich Reihe Energie $\&$
Umwelt / Energy $\&$ Environment},
pages = {132 S.},
year = {2015},
note = {RWTH Aachen, Diss., 2014},
abstract = {Microcrystalline silicon $\mu$c-Si:H thin film solar cells
with an n-i-p configuration were setup based on the
optimized processes for solar cells with a p-i-n
configuration. The depositionprocesses of window, absorber
and front contact layers were optimized. The effects of
thethickness and doping ratio of p-type layers, the
thickness of the front contact layers and thesilane
concentration of the absorber layers on the solar cell
performance were investigated. For all the optimization and
investigation, solar cells were prepared on simple
glass/etched-ZnO substrates. To improve the short circuit
current density, a highly reflective Ag/ZnO back reflector
was added on glass/etched-ZnO substrates. Finally, a good
process reproducibility and high cell performance were
achieved as a base for the subsequent study of light
scattering and trapping in $\mu$c-Si:H n-i-p solar cells.The
effects of the surface morphology of back reflectors on
their light-scattering properties and the light trapping in
$\mu$c-Si:H n-i-p solar cells were investigated. Firstly,
the surfaces of sputtered ZnO layers were textured by
etching them in HCl solution. The surface morphology was
varied by changing the as-deposited ZnO thickness and
etching time and measured by Atomic Force Microscopy AFM.
Based on the AFM measurement results, statistically
evaluation of the ZnO surface morphology was performed in
terms of not only therms roughness but also the diameter,
depth and angle of surface features (craters) on
thesurfaces. With such evaluation, the relationship between
the surface morphology and lightscatteringproperties of
reflectors was analysed and related to different physical
mechanisms,such as diffraction and geometrical optics.
Finally, etched-ZnO layers with different
surfacemorphologies were covered with a thin Ag and ZnO
layer and used together as back reflectorsin $\mu$c-Si:H
n-i-p solar cells. This allows us to analyse the direct link
between the surface morphology of back reflectors and light
trapping in the solar cells. With this analysis, the most
beneficial size and angle of craters for light trapping were
estimated. In addition, to better understand the light
trapping process in the solar cells, angular intensity
distributions AIDs in silicon were simulated by the
so-called “phase model” both for the transmission at the
ZnO/$}mu$c-Si:H interface (as on the front side of solar
cells) and for the reflection at the back reflector. The
AIDs for the transmission were compared to those for the
reflection with the same interface morphologies to estimate
the dominant scattering process regarding the light trapping
in solar cells.},
keywords = {Dissertation (GND)},
cin = {IEK-5},
cid = {I:(DE-Juel1)IEK-5-20101013},
pnm = {121 - Solar cells of the next generation (POF3-121)},
pid = {G:(DE-HGF)POF3-121},
typ = {PUB:(DE-HGF)11 / PUB:(DE-HGF)3},
url = {https://juser.fz-juelich.de/record/190090},
}