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| 001 | 19474 | ||
| 005 | 20240610120844.0 | ||
| 017 | _ | _ | |a This version is available at the following Publisher URL: http://apl.aip.org |
| 024 | 7 | _ | |a 10.1007/s003390101059 |2 DOI |
| 024 | 7 | _ | |a WOS:000175356400011 |2 WOS |
| 024 | 7 | _ | |a 2128/1045 |2 Handle |
| 024 | 7 | _ | |a altmetric:21807437 |2 altmetric |
| 037 | _ | _ | |a PreJuSER-19474 |
| 041 | _ | _ | |a eng |
| 082 | _ | _ | |a 530 |
| 084 | _ | _ | |2 WoS |a Materials Science, Multidisciplinary |
| 084 | _ | _ | |2 WoS |a Physics, Applied |
| 100 | 1 | _ | |a Ebert, P. |b 0 |u FZJ |0 P:(DE-Juel1)VDB5012 |
| 245 | _ | _ | |a Defects in III-V semiconductor surfaces |
| 260 | _ | _ | |a Melville, NY |b American Institute of Physics |c 2002 |
| 300 | _ | _ | |a 101 - 112 |
| 336 | 7 | _ | |a Journal Article |0 PUB:(DE-HGF)16 |2 PUB:(DE-HGF) |
| 336 | 7 | _ | |a Output Types/Journal article |2 DataCite |
| 336 | 7 | _ | |a Journal Article |0 0 |2 EndNote |
| 336 | 7 | _ | |a ARTICLE |2 BibTeX |
| 336 | 7 | _ | |a JOURNAL_ARTICLE |2 ORCID |
| 336 | 7 | _ | |a article |2 DRIVER |
| 440 | _ | 0 | |a Applied Physics Letters |x 0003-6951 |0 562 |v A 75 |
| 500 | _ | _ | |a Record converted from VDB: 12.11.2012 |
| 520 | _ | _ | |a This work reports the measurement of the nanoscale physical properties of surface vacancies and the extraction of the types and concentrations of dopant atoms and point defects inside compound semiconductors, primarily by cross-sectional scanning tunneling microscopy on cleavage surfaces of III-V semiconductors. The results provide the basis to determine the physical mechanisms governing the interactions, the formation, the electronic properties, and the compensation effects of surface as well as bulk point defects and dopant atoms. |
| 536 | _ | _ | |a Kondensierte Materie |c M02 |2 G:(DE-HGF) |0 G:(DE-Juel1)FUEK242 |x 0 |
| 588 | _ | _ | |a Dataset connected to Web of Science |
| 650 | _ | 7 | |a J |2 WoSType |
| 773 | _ | _ | |a 10.1007/s003390101059 |g Vol. 75, p. 101 - 112 |p 101 - 112 |q 75<101 - 112 |0 PERI:(DE-600)1469436-0 |t Applied physics letters |v 75 |y 2002 |x 0003-6951 |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/19474/files/13432.pdf |y OpenAccess |
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| 913 | 1 | _ | |k M02 |v Kondensierte Materie |l Kondensierte Materie |b Materie |0 G:(DE-Juel1)FUEK242 |x 0 |
| 914 | 1 | _ | |y 2002 |
| 915 | _ | _ | |0 StatID:(DE-HGF)0010 |a JCR/ISI refereed |
| 915 | _ | _ | |2 StatID |0 StatID:(DE-HGF)0510 |a OpenAccess |
| 920 | 1 | _ | |k IFF-IMF |l Mikrostrukturforschung |d 31.12.2006 |g IFF |0 I:(DE-Juel1)VDB37 |x 0 |
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| 981 | _ | _ | |a I:(DE-Juel1)ER-C-1-20170209 |
| 981 | _ | _ | |a I:(DE-Juel1)PGI-5-20110106 |
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