%0 Journal Article
%A Posseik, Francois
%A Giovanelli, L.
%A Amsalem, P.
%A Petaccia, L.
%A Topwal, D.
%A Gorovikov, S.
%A Abel, M.
%A Koch, N.
%A Porte, L.
%A Goldoni, A.
%A Themlin, J.-M.
%T Final-state diffraction effects in angle-resolved photoemission at an organic-metal interface
%J Physical review / B
%V 84
%N 24
%@ 1098-0121
%C College Park, Md.
%I APS
%M PreJuSER-19653
%P 241407
%D 2011
%Z The authors acknowledge V. N. Strocov for fruitful discussions. D. Lonza is acknowledged for technical assistance during the experiments. P.A. and N.K. gratefully acknowledge financial support by the DFG.
%X In this paper it is shown that angle-resolved photoemission performed using low-energy photons on an organicmetal interface allows to clearly distinguish genuine interface states from features of substrate photoelectrons diffracted by the molecular lattice. As a model system an ordered monolayer of Zn-phthalocyanine is used as a diffraction lattice to probe the electronic band structure of a Ag(110) substrate. Photoemission close to normal emission geometry reveals strongly dispersive features absent in the pristine substrate spectra. Density functional theory modeling helped identifying these as bulk sp direct transitions undergoing surface-umklapp processes. The present results establish the important role of final-state diffraction effects in photoemission experiments at organic-inorganic interfaces.
%K J (WoSType)
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000298563100001
%R 10.1103/PhysRevB.84.241407
%U https://juser.fz-juelich.de/record/19653