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001     19966
005     20180208201427.0
024 7 _ |2 DOI
|a 10.1016/j.elspec.2010.12.017
024 7 _ |2 WOS
|a WOS:000292173400048
037 _ _ |a PreJuSER-19966
041 _ _ |a eng
082 _ _ |a 620
084 _ _ |2 WoS
|a Spectroscopy
100 1 _ |0 P:(DE-Juel1)VDB5644
|a Adam, R.
|b 0
|u FZJ
245 _ _ |a Time-resolved measurements of Ni(80)Fe(20)/MgO/Co trilayers in the extreme ultraviolet range
260 _ _ |a New York, NY [u.a.]
|b Elsevier
|c 2011
336 7 _ |a Journal Article
|0 PUB:(DE-HGF)16
|2 PUB:(DE-HGF)
336 7 _ |a Output Types/Journal article
|2 DataCite
336 7 _ |a Journal Article
|0 0
|2 EndNote
336 7 _ |a ARTICLE
|2 BibTeX
336 7 _ |a JOURNAL_ARTICLE
|2 ORCID
336 7 _ |a article
|2 DRIVER
440 _ 0 |0 3267
|a Journal of Electron Spectroscopy and Related Phenomena
|v 184
|x 0368-2048
|y 3
500 _ _ |3 POF3_Assignment on 2016-02-29
500 _ _ |a We acknowledge our colleagues B. Kupper, J. Lauer and H. Pfeifer for their support in construction, software and electronics development. We thank R. Schreiber for the sample preparation. We appreciate the work of Dr. M. Nagel from RWTH Aachen whose group characterized the CPW. Financial support through the BMBF (project No. 05KS7UK1) is gratefully appreciated.
520 _ _ |a We performed an element-selective magneto-optic characterization of Ni80Fe20/MgO/Co magnetic trilayers employing the resonant magnetic reflectivity of extreme ultraviolet (XUV) radiation tuned to the M absorption edges of cobalt (60.2 eV) and nickel (67.5 eV). Static reflectivity shows a large magnetic contrast of up to 80% for the top Co and 20% for the buried Ni80Fe20 layers. The magneto-dynamic response of the trilayers to the ultrashort field pulse exhibits oscillations in a frequency range of up to 6.5 GHz associated exclusively with magnetization dynamics of the top Co layer. The presented results demonstrate the feasibility of element-specific magneto-dynamic studies of magnetic multilayers employing resonant XUV reflectivity at the M absorption edges. (C) 2010 Elsevier B.V. All rights reserved.
536 _ _ |0 G:(DE-Juel1)FUEK412
|2 G:(DE-HGF)
|a Grundlagen für zukünftige Informationstechnologien
|c P42
|x 0
588 _ _ |a Dataset connected to Web of Science
650 _ 7 |2 WoSType
|a J
653 2 0 |2 Author
|a Magnetic multilayers
653 2 0 |2 Author
|a Time-resolved MOKE
653 2 0 |2 Author
|a Pump-probe
653 2 0 |2 Author
|a Extreme ultraviolet
653 2 0 |2 Author
|a XUV
653 2 0 |2 Author
|a Element-selectivity
700 1 _ |0 P:(DE-Juel1)VDB86407
|a Grychtol, P.
|b 1
|u FZJ
700 1 _ |0 P:(DE-Juel1)130601
|a Cramm, S.
|b 2
|u FZJ
700 1 _ |0 P:(DE-Juel1)130948
|a Schneider, C.M.
|b 3
|u FZJ
773 _ _ |0 PERI:(DE-600)1491139-5
|a 10.1016/j.elspec.2010.12.017
|g Vol. 184
|q 184
|t Journal of electron spectroscopy and related phenomena
|v 184
|x 0368-2048
|y 2011
856 7 _ |u http://dx.doi.org/10.1016/j.elspec.2010.12.017
909 C O |o oai:juser.fz-juelich.de:19966
|p VDB
913 1 _ |0 G:(DE-Juel1)FUEK412
|a DE-HGF
|b Schlüsseltechnologien
|k P42
|l Grundlagen für zukünftige Informationstechnologien (FIT)
|v Grundlagen für zukünftige Informationstechnologien
|x 0
913 2 _ |a DE-HGF
|b Key Technologies
|l Future Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)
|1 G:(DE-HGF)POF3-520
|0 G:(DE-HGF)POF3-529H
|2 G:(DE-HGF)POF3-500
|v Addenda
|x 0
914 1 _ |y 2011
915 _ _ |0 StatID:(DE-HGF)0010
|a JCR/ISI refereed
920 1 _ |0 I:(DE-Juel1)PGI-6-20110106
|g PGI
|k PGI-6
|l Elektronische Eigenschaften
|x 0
970 _ _ |a VDB:(DE-Juel1)135019
980 _ _ |a VDB
980 _ _ |a ConvertedRecord
980 _ _ |a journal
980 _ _ |a I:(DE-Juel1)PGI-6-20110106
980 _ _ |a UNRESTRICTED

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