Hauptseite > Publikationsdatenbank > Interface kinetics in phase-field models: Isothermal transformations in binary alloys and step dynamics in molecular-beam epitaxy > print |
001 | 201464 | ||
005 | 20230217124355.0 | ||
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100 | 1 | _ | |a Boussinot, G. |0 P:(DE-Juel1)130562 |b 0 |
245 | _ | _ | |a Interface kinetics in phase-field models: Isothermal transformations in binary alloys and step dynamics in molecular-beam epitaxy |
260 | _ | _ | |a College Park, Md. |c 2013 |b APS |
264 | _ | 1 | |3 online |2 Crossref |b American Physical Society (APS) |c 2013-08-26 |
264 | _ | 1 | |3 print |2 Crossref |b American Physical Society (APS) |c 2013-08-01 |
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520 | _ | _ | |a We present a unified description of interface kinetic effects in phase-field models for isothermal transformations in binary alloys and steps dynamics in molecular-beam-epitaxy. The phase-field equations of motion incorporate a kinetic cross-coupling between the phase field and the concentration field. This cross-coupling generalizes the phenomenology of kinetic effects and was omitted until recently in classical phase-field models. We derive general expressions (independent of the details of the phase-field model) for the kinetic coefficients within the corresponding macroscopic approach using a physically motivated reduction procedure. The latter is equivalent to the so-called thin-interface limit but is technically simpler. It involves the calculation of the effective dissipation that can be ascribed to the interface in the phase-field model. We discuss in detail the possibility of a nonpositive definite matrix of kinetic coefficients, i.e., a negative effective interface dissipation, although being in the range of stability of the underlying phase-field model. Numerically we study the step-bunching instability in molecular-beam-epitaxy due to the Ehrlich-Schwoebel effect, present in our model due to the cross-coupling. Using the reduction procedure we compare the results of the phase-field simulations with the analytical predictions of the macroscopic approach. |
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700 | 1 | _ | |a Brener, Efim |0 P:(DE-Juel1)130567 |b 1 |e Corresponding Author |
773 | 1 | 8 | |a 10.1103/physreve.88.022406 |b American Physical Society (APS) |d 2013-08-26 |n 2 |p 022406 |3 journal-article |2 Crossref |t Physical Review E |v 88 |y 2013 |x 1539-3755 |
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