000201477 001__ 201477
000201477 005__ 20210129215801.0
000201477 0247_ $$2doi$$a10.1109/TED.2015.2411748
000201477 0247_ $$2ISSN$$a0018-9383
000201477 0247_ $$2ISSN$$a
000201477 0247_ $$2ISSN$$a0096-2430
000201477 0247_ $$2ISSN$$a0197-6370
000201477 0247_ $$2ISSN$$a1557-9646
000201477 0247_ $$2WOS$$aWOS:000353564600029
000201477 037__ $$aFZJ-2015-03772
000201477 041__ $$aEnglish
000201477 082__ $$a620
000201477 1001_ $$0P:(DE-HGF)0$$aNishi, Yoshifumi$$b0$$eCorresponding Author
000201477 245__ $$aEffect of RESET Voltage on Distribution of SET Switching Time of Bipolar Resistive Switching in a Tantalum Oxide Thin Film
000201477 260__ $$aNew York, NY$$bIEEE$$c2015
000201477 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1435136012_21690
000201477 3367_ $$2DataCite$$aOutput Types/Journal article
000201477 3367_ $$00$$2EndNote$$aJournal Article
000201477 3367_ $$2BibTeX$$aARTICLE
000201477 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000201477 3367_ $$2DRIVER$$aarticle
000201477 520__ $$aThe distribution of SET switching time of bipolar switching tantalum oxide thin films is studied using pulse measurement techniques. SET switching times are measured by repeating SET and RESET operations in a single cell. It is found that the distribution measured with a high RESET voltage can be well described by a steep Weibull distribution with a shape parameter >1, but lowering the RESET voltage results in a broad distribution at high cumulative frequencies. Statistical analysis shows that this broadening of the distribution can be attributed to the variation of initial conditions for SET, whereas a steep Weibull distribution points to an aging process leading to SET under a voltage stress. It is also shown that although the power of the leakage current before SET determines the fastest limit of the SET switching speed, those SET in the broadened distributions are delayed due to gradual current increase prior to the SET. The waiting time for the start of the gradual current increase has a correlation with the power of the leakage current, showing that Joule heating effect is still a significant factor in the SET mechanism even if the SET time distribution is broadened due to the variation of initial states programmed by low RESET voltages.
000201477 536__ $$0G:(DE-HGF)POF3-524$$a524 - Controlling Collective States (POF3-524)$$cPOF3-524$$fPOF III$$x0
000201477 588__ $$aDataset connected to CrossRef, juser.fz-juelich.de
000201477 7001_ $$0P:(DE-HGF)0$$aFleck, Karsten$$b1
000201477 7001_ $$0P:(DE-HGF)0$$aBottger, Ulrich$$b2
000201477 7001_ $$0P:(DE-HGF)0$$aWaser, Rainer$$b3
000201477 7001_ $$0P:(DE-Juel1)158062$$aMenzel, Stephan$$b4
000201477 773__ $$0PERI:(DE-600)2028088-9$$a10.1109/TED.2015.2411748$$gVol. 62, no. 5, p. 1561 - 1567$$n5$$p1561 - 1567$$tIEEE transactions on electron devices$$v62$$x1557-9646$$y2015
000201477 8564_ $$uhttps://juser.fz-juelich.de/record/201477/files/07067386.pdf$$yRestricted
000201477 8564_ $$uhttps://juser.fz-juelich.de/record/201477/files/07067386.gif?subformat=icon$$xicon$$yRestricted
000201477 8564_ $$uhttps://juser.fz-juelich.de/record/201477/files/07067386.jpg?subformat=icon-1440$$xicon-1440$$yRestricted
000201477 8564_ $$uhttps://juser.fz-juelich.de/record/201477/files/07067386.jpg?subformat=icon-180$$xicon-180$$yRestricted
000201477 8564_ $$uhttps://juser.fz-juelich.de/record/201477/files/07067386.jpg?subformat=icon-640$$xicon-640$$yRestricted
000201477 8564_ $$uhttps://juser.fz-juelich.de/record/201477/files/07067386.pdf?subformat=pdfa$$xpdfa$$yRestricted
000201477 909CO $$ooai:juser.fz-juelich.de:201477$$pVDB
000201477 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-HGF)0$$aForschungszentrum Jülich GmbH$$b3$$kFZJ
000201477 9101_ $$0I:(DE-588b)5008462-8$$6P:(DE-Juel1)158062$$aForschungszentrum Jülich GmbH$$b4$$kFZJ
000201477 9130_ $$0G:(DE-HGF)POF2-424$$1G:(DE-HGF)POF2-420$$2G:(DE-HGF)POF2-400$$aDE-HGF$$bSchlüsseltechnologien$$lGrundlagen für zukünftige Informationstechnologien$$vExploratory materials and phenomena$$x0
000201477 9131_ $$0G:(DE-HGF)POF3-524$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Collective States$$x0
000201477 9141_ $$y2015
000201477 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR
000201477 915__ $$0StatID:(DE-HGF)0110$$2StatID$$aWoS$$bScience Citation Index
000201477 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded
000201477 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection
000201477 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bThomson Reuters Master Journal List
000201477 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS
000201477 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline
000201477 915__ $$0StatID:(DE-HGF)1160$$2StatID$$aDBCoverage$$bCurrent Contents - Engineering, Computing and Technology
000201477 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF <  5
000201477 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000201477 980__ $$ajournal
000201477 980__ $$aVDB
000201477 980__ $$aI:(DE-Juel1)PGI-7-20110106
000201477 980__ $$aUNRESTRICTED