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@ARTICLE{Nishi:201477,
      author       = {Nishi, Yoshifumi and Fleck, Karsten and Bottger, Ulrich and
                      Waser, Rainer and Menzel, Stephan},
      title        = {{E}ffect of {RESET} {V}oltage on {D}istribution of {SET}
                      {S}witching {T}ime of {B}ipolar {R}esistive {S}witching in a
                      {T}antalum {O}xide {T}hin {F}ilm},
      journal      = {IEEE transactions on electron devices},
      volume       = {62},
      number       = {5},
      issn         = {1557-9646},
      address      = {New York, NY},
      publisher    = {IEEE},
      reportid     = {FZJ-2015-03772},
      pages        = {1561 - 1567},
      year         = {2015},
      abstract     = {The distribution of SET switching time of bipolar switching
                      tantalum oxide thin films is studied using pulse measurement
                      techniques. SET switching times are measured by repeating
                      SET and RESET operations in a single cell. It is found that
                      the distribution measured with a high RESET voltage can be
                      well described by a steep Weibull distribution with a shape
                      parameter >1, but lowering the RESET voltage results in a
                      broad distribution at high cumulative frequencies.
                      Statistical analysis shows that this broadening of the
                      distribution can be attributed to the variation of initial
                      conditions for SET, whereas a steep Weibull distribution
                      points to an aging process leading to SET under a voltage
                      stress. It is also shown that although the power of the
                      leakage current before SET determines the fastest limit of
                      the SET switching speed, those SET in the broadened
                      distributions are delayed due to gradual current increase
                      prior to the SET. The waiting time for the start of the
                      gradual current increase has a correlation with the power of
                      the leakage current, showing that Joule heating effect is
                      still a significant factor in the SET mechanism even if the
                      SET time distribution is broadened due to the variation of
                      initial states programmed by low RESET voltages.},
      cin          = {PGI-7},
      ddc          = {620},
      cid          = {I:(DE-Juel1)PGI-7-20110106},
      pnm          = {524 - Controlling Collective States (POF3-524)},
      pid          = {G:(DE-HGF)POF3-524},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000353564600029},
      doi          = {10.1109/TED.2015.2411748},
      url          = {https://juser.fz-juelich.de/record/201477},
}