%0 Journal Article
%A Häussler, Dietrich
%A Houben, Lothar
%A Essig, Stephanie
%A Kurttepeli, Mert
%A Dimroth, Frank
%A Dunin-Borkowski, Rafal E.
%A Jäger, Wolfgang
%T Aberration-corrected transmission electron microscopy analyses of GaAs/Si interfaces in wafer-bonded multi-junction solar cells
%J Ultramicroscopy
%V 134
%@ 0304-3991
%C Amsterdam
%I Elsevier Science
%M FZJ-2015-03836
%P 55 - 61
%D 2013
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000324474900009
%R 10.1016/j.ultramic.2013.07.005
%U https://juser.fz-juelich.de/record/201542