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000201542 1001_ $$0P:(DE-HGF)0$$aHäussler, Dietrich$$b0
000201542 245__ $$aAberration-corrected transmission electron microscopy analyses of GaAs/Si interfaces in wafer-bonded multi-junction solar cells
000201542 260__ $$aAmsterdam$$bElsevier Science$$c2013
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000201542 7001_ $$0P:(DE-Juel1)130723$$aHouben, Lothar$$b1$$ufzj
000201542 7001_ $$0P:(DE-HGF)0$$aEssig, Stephanie$$b2
000201542 7001_ $$0P:(DE-HGF)0$$aKurttepeli, Mert$$b3
000201542 7001_ $$0P:(DE-HGF)0$$aDimroth, Frank$$b4
000201542 7001_ $$0P:(DE-HGF)0$$aDunin-Borkowski, Rafal E.$$b5
000201542 7001_ $$0P:(DE-Juel1)166398$$aJäger, Wolfgang$$b6$$eCorresponding Author
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