TY  - JOUR
AU  - Häussler, Dietrich
AU  - Houben, Lothar
AU  - Essig, Stephanie
AU  - Kurttepeli, Mert
AU  - Dimroth, Frank
AU  - Dunin-Borkowski, Rafal E.
AU  - Jäger, Wolfgang
TI  - Aberration-corrected transmission electron microscopy analyses of GaAs/Si interfaces in wafer-bonded multi-junction solar cells
JO  - Ultramicroscopy
VL  - 134
SN  - 0304-3991
CY  - Amsterdam
PB  - Elsevier Science
M1  - FZJ-2015-03836
SP  - 55 - 61
PY  - 2013
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000324474900009
DO  - DOI:10.1016/j.ultramic.2013.07.005
UR  - https://juser.fz-juelich.de/record/201542
ER  -