%0 Journal Article
%A Zhu, Y.
%A Soukiassian, A.
%A Schlom, D. G.
%A Muller, D. A.
%A Dwyer, C.
%T Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy
%J Applied physics letters
%V 103
%N 14
%@ 0003-6951
%C Melville, NY
%I American Inst. of Physics
%M FZJ-2015-03841
%P 141908 -
%D 2013
%X Atomic-resolution elemental maps of materials obtained using energy-loss spectroscopy in the scanning transmission electron microscope (STEM) can contain artifacts associated with strong elastic scattering of the STEM probe. We demonstrate how recent advances in instrumentation enable a simple and robust approach to reduce such artifacts and produce atomic-resolution elemental maps amenable to direct visual interpretation. The concept is demonstrated experimentally for a (BaTiO3)8/(SrTiO3)4 heterostructure, and simulations are used for quantitative analysis. We also demonstrate that the approach can be used to eliminate the atomic-resolution elastic contrast in maps obtained from lower-energy excitations, such as plasmon excitations.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000325488500029
%R 10.1063/1.4823704
%U https://juser.fz-juelich.de/record/201547