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000201547 1001_ $$0P:(DE-Juel1)156366$$aZhu, Y.$$b0$$ufzj
000201547 245__ $$aTowards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy
000201547 260__ $$aMelville, NY$$bAmerican Inst. of Physics$$c2013
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000201547 520__ $$aAtomic-resolution elemental maps of materials obtained using energy-loss spectroscopy in the scanning transmission electron microscope (STEM) can contain artifacts associated with strong elastic scattering of the STEM probe. We demonstrate how recent advances in instrumentation enable a simple and robust approach to reduce such artifacts and produce atomic-resolution elemental maps amenable to direct visual interpretation. The concept is demonstrated experimentally for a (BaTiO3)8/(SrTiO3)4 heterostructure, and simulations are used for quantitative analysis. We also demonstrate that the approach can be used to eliminate the atomic-resolution elastic contrast in maps obtained from lower-energy excitations, such as plasmon excitations.
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000201547 7001_ $$0P:(DE-HGF)0$$aSoukiassian, A.$$b1
000201547 7001_ $$0P:(DE-HGF)0$$aSchlom, D. G.$$b2
000201547 7001_ $$0P:(DE-HGF)0$$aMuller, D. A.$$b3
000201547 7001_ $$0P:(DE-Juel1)159157$$aDwyer, C.$$b4$$ufzj
000201547 773__ $$0PERI:(DE-600)1469436-0$$a10.1063/1.4823704$$gVol. 103, no. 14, p. 141908 -$$n14$$p141908 -$$tApplied physics letters$$v103$$x0003-6951$$y2013
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