TY  - JOUR
AU  - Zhu, Y.
AU  - Soukiassian, A.
AU  - Schlom, D. G.
AU  - Muller, D. A.
AU  - Dwyer, C.
TI  - Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy
JO  - Applied physics letters
VL  - 103
IS  - 14
SN  - 0003-6951
CY  - Melville, NY
PB  - American Inst. of Physics
M1  - FZJ-2015-03841
SP  - 141908 -
PY  - 2013
AB  - Atomic-resolution elemental maps of materials obtained using energy-loss spectroscopy in the scanning transmission electron microscope (STEM) can contain artifacts associated with strong elastic scattering of the STEM probe. We demonstrate how recent advances in instrumentation enable a simple and robust approach to reduce such artifacts and produce atomic-resolution elemental maps amenable to direct visual interpretation. The concept is demonstrated experimentally for a (BaTiO3)8/(SrTiO3)4 heterostructure, and simulations are used for quantitative analysis. We also demonstrate that the approach can be used to eliminate the atomic-resolution elastic contrast in maps obtained from lower-energy excitations, such as plasmon excitations.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000325488500029
DO  - DOI:10.1063/1.4823704
UR  - https://juser.fz-juelich.de/record/201547
ER  -