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@ARTICLE{Zhu:201547,
author = {Zhu, Y. and Soukiassian, A. and Schlom, D. G. and Muller,
D. A. and Dwyer, C.},
title = {{T}owards artifact-free atomic-resolution elemental mapping
with electron energy-loss spectroscopy},
journal = {Applied physics letters},
volume = {103},
number = {14},
issn = {0003-6951},
address = {Melville, NY},
publisher = {American Inst. of Physics},
reportid = {FZJ-2015-03841},
pages = {141908 -},
year = {2013},
abstract = {Atomic-resolution elemental maps of materials obtained
using energy-loss spectroscopy in the scanning transmission
electron microscope (STEM) can contain artifacts associated
with strong elastic scattering of the STEM probe. We
demonstrate how recent advances in instrumentation enable a
simple and robust approach to reduce such artifacts and
produce atomic-resolution elemental maps amenable to direct
visual interpretation. The concept is demonstrated
experimentally for a (BaTiO3)8/(SrTiO3)4 heterostructure,
and simulations are used for quantitative analysis. We also
demonstrate that the approach can be used to eliminate the
atomic-resolution elastic contrast in maps obtained from
lower-energy excitations, such as plasmon excitations.},
cin = {PGI-5},
ddc = {530},
cid = {I:(DE-Juel1)PGI-5-20110106},
pnm = {42G - Peter Grünberg-Centre (PG-C) (POF2-42G41) / HITEC -
Helmholtz Interdisciplinary Doctoral Training in Energy and
Climate Research (HITEC) (HITEC-20170406)},
pid = {G:(DE-HGF)POF2-42G41 / G:(DE-Juel1)HITEC-20170406},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000325488500029},
doi = {10.1063/1.4823704},
url = {https://juser.fz-juelich.de/record/201547},
}