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| Hauptseite > Publikationsdatenbank > Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy > print |
| Hauptseite > Publikationsdatenbank > Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy > print |
| 001 | 201547 | ||
| 005 | 20240610120421.0 | ||
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| 100 | 1 | _ | |a Zhu, Y. |0 P:(DE-Juel1)156366 |b 0 |u fzj |
| 245 | _ | _ | |a Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy |
| 260 | _ | _ | |a Melville, NY |c 2013 |b American Inst. of Physics |
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| 520 | _ | _ | |a Atomic-resolution elemental maps of materials obtained using energy-loss spectroscopy in the scanning transmission electron microscope (STEM) can contain artifacts associated with strong elastic scattering of the STEM probe. We demonstrate how recent advances in instrumentation enable a simple and robust approach to reduce such artifacts and produce atomic-resolution elemental maps amenable to direct visual interpretation. The concept is demonstrated experimentally for a (BaTiO3)8/(SrTiO3)4 heterostructure, and simulations are used for quantitative analysis. We also demonstrate that the approach can be used to eliminate the atomic-resolution elastic contrast in maps obtained from lower-energy excitations, such as plasmon excitations. |
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| 773 | _ | _ | |a 10.1063/1.4823704 |g Vol. 103, no. 14, p. 141908 - |0 PERI:(DE-600)1469436-0 |n 14 |p 141908 - |t Applied physics letters |v 103 |y 2013 |x 0003-6951 |
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